| Literature DB >> 29283394 |
Pan Liu1, Xiaoyang Lin2,3, Yong Xu4,5, Boyu Zhang6, Zhizhong Si7, Kaihua Cao8, Jiaqi Wei9, Weisheng Zhao10,11.
Abstract
The magnetoresistance effect in sandwiched structure describes the appreciable magnetoresistance effect of a device with a stacking of two ferromagnetic layers separated by a non-magnetic layer (i.e., a sandwiched structure). The development of this effect has led to the revolution of memory applications during the past decades. In this review, we revisited the magnetoresistance effect and the interlayer exchange coupling (IEC) effect in magnetic sandwiched structures with a spacer layer of non-magnetic metal, semiconductor or organic thin film. We then discussed the optical modulation of this effect via different methods. Finally, we discuss various applications of these effects and present a perspective to realize ultralow-power, high-speed data writing and inter-chip connection based on this tunable magnetoresistance effect.Entities:
Keywords: data storage; interlayer exchange coupling; magnetoresistance effect; optically tunable; spintronics
Year: 2017 PMID: 29283394 PMCID: PMC5793545 DOI: 10.3390/ma11010047
Source DB: PubMed Journal: Materials (Basel) ISSN: 1996-1944 Impact factor: 3.623
Figure 1(a) Schematic of a GMR device with a FM layer/spacer layer/FM layer stacking. The thickness of the spacer layer is labeled as d; (b) GMR read-head for hard drive [2]. Reproduced with permission from [2].
Figure 2Electron distribution schema of the (a) AFM coupling and (b) FM coupling state. At the ground state, electrons occupy only those states below the Fermi level (E) (occupied states are colored blue, unoccupied colored gray).
Figure 3Examples of potential materials for the OTMR effect. Including AOS materials for the FM layer [95]; and phase-transition material VO2, organic and inorganic photosensitive materials for the spacer. Reproduced with permission from [95].
Figure 4Device demonstration of AOS in an MTJ with subpicosecond single laser pulses without external magnetic field at RT. (a) Schematic of the MTJ structure used in the experiment; (b) Optical microscope image of a typical MTJ device with an indium tin oxide (ITO) electrode on the top for TMR measurement; (c) The RTMR(H) minor loop measured by sweeping a perpendicular magnetic field, which switches the Co/Pd layers (R and H represent resistance and magnetic field separately). The red line is the smoothing of the raw data (open circles); (d) RTMR of the MTJ device measured during AOS by 0.4-ps single laser pulses at 0.5-Hz repetition rate. The changes of RTMR in (c,d) have the same value of ~0.6 ± 0.05 Ω, indicating the GdFeCo layer has been completely switched. Reproduced with permission from [112].
Figure 5Schematic of the potential applications of the OTMR effect (a) Data writing in optical control MR chip. This chip, based on the OTMR devices array, can serve as a memory module in the following chips in (b); (b) Inter-chip optical communication. According to the data stored in the “Memory Array” on Chip-1, the laser beam from the “On-Chip Laser” can be modulated by the “Optical Modulator” to convey the information. Once another chip (“Chip-2”) receives the modulated laser beam from Chip-1, the “Optical Demodulator + X” unit will demodulate the beam and then write the “Memory Array” on Chip-2 in an optical writing way utilizing the laser-induced change of MR (the “X” may be a laser demultiplexer to perform selected data writing into specific memory unit).