| Literature DB >> 29160860 |
Francesco Floris1, Lucia Fornasari2, Andrea Marini3, Vittorio Bellani4, Francesco Banfi5, Stefano Roddaro6, Daniele Ercolani7, Mirko Rocci8, Fabio Beltram9, Marco Cecchini10, Lucia Sorba11, Francesco Rossella12.
Abstract
Subwavelength nanostructured surfaces are realized with self-assembled vertically-aligned InAs nanowires, and their functionalities as optical reflectors are investigated. In our system, polarization-resolved specular reflectance displays strong modulations as a function of incident photon energy and angle. An effective-medium model allows one to rationalize the experimental findings in the long wavelength regime, whereas numerical simulations fully reproduce the experimental outcomes in the entire frequency range. The impact of the refractive index of the medium surrounding the nanostructure assembly on the reflectance was estimated. In view of the present results, sensing schemes compatible with microfluidic technologies and routes to innovative nanowire-based optical elements are discussed.Entities:
Keywords: nanostructured optical surface; semiconductor nanowire; sensing; specular reflectance; sub-wavelength nanostructures
Year: 2017 PMID: 29160860 PMCID: PMC5707617 DOI: 10.3390/nano7110400
Source DB: PubMed Journal: Nanomaterials (Basel) ISSN: 2079-4991 Impact factor: 5.076
Figure 1(a) Schematics of a set of samples used in this work: (i) the InAs substrate; (ii) the InAs substrate with dispersed Au-rich catalyst nanoparticles; (iii) the InAs substrate with the InAs nanowire (NW) assembly; (b) ≈ 45 tilted scanning electron micrograph of InAs NWs (density ≈ 30 NW/m, diameter ≈ 50 nm, length ≈ 950 nm); (c) as light impinges on the NW assembly, photons with a short wavelength interact with few individual NWs, while large wavelengths see the whole assembly as an effective-medium; (d) diffraction and interference effects give rise to reflectance oscillations versus photon wavelength and incidence angle.
Figure 2Angle- and energy-resolved reflectance modulations. Logarithmic color plot of the angle- and energy-resolved specular reflectance measured on the InAs substrate with the dispersed Au-rich NPs (a,c) and on the InAs NWs (e,g). Reflectance spectra measured at different incident photon angle (indicated by different color curves) for the Au-rich NPs dispersed on the InAs substrate (b,d) and for the InAs NWs (f,h). Transverse electric (TE) and magnetic (TM) light polarizations are indicated by labels. Marked reflectance modulations versus photon energy and incidence light angle occur in the InAs NWs, while almost featureless reflectance is observed for the InAs substrate with dispersed Au-rich NPs.
Figure 3Effective-medium calculation of reflectance modulations. Logarithmic color plot of the angle- and energy-resolved reflectance calculated for InAs NWs using the effective-medium approximation for (a) TE polarization and (c) TM polarization, respectively. Reflectance spectra calculated at several different angles, for (b) TE and (d) TM polarizations.
Figure 4Numerical simulations of the near-field spatial distributions and reflectance. Normalized spatial distribution of the electric (a) and magnetic (b) field, calculated for the InAs NWs (density ≈ 30 NW/m, length 950 nm, diameter ≈ 45 nm) for TM-wave at 70 and at 1035 nm. The white crosses indicate the centers of the NWs. and represent the incident electric and magnetic field, respectively. (c,d) Calculated (dashed line) and measured (solid line) reflectance for the two polarizations.
Figure 5Effect of different media filling the InAs nanowire assembly. Optical response calculated for different media surrounding the NWs, for TE (a) and TM (b) polarization. The filling media are indicated in (b). Sensitivity or relative reflectance variation S = (R − )/ for TE (c) and TM (d) polarizations. The incidence angle is 55.