Literature DB >> 29091646

Polarized optical scattering by inhomogeneities and surface roughness in an anisotropic thin film.

Thomas A Germer, Katelynn A Sharma, Thomas G Brown, James B Oliver.   

Abstract

We extend the theory of Kassam et al. [J. Opt. Soc. Am. A12, 2009 (1995)JOAOD60740-323210.1364/JOSAA.12.002009] for scattering by oblique columnar structure thin films to include the induced form birefringence and the propagation of radiation in those films. We generalize the 4×4 matrix theory of Berreman [J. Opt. Soc. Am.62, 502 (1972)JOSAAH0030-394110.1364/JOSA.62.000502] to include arbitrary sources in the layer, which are necessary to determine the Green function for the inhomogeneous wave equation. We further extend first-order vector perturbation theory for scattering by roughness in the smooth surface limit, when the layer is anisotropic. Scattering by an inhomogeneous medium is approximated by a distorted Born approximation, where effective medium theory is used to determine the effective properties of the medium, and strong fluctuation theory is used to determine the inhomogeneous sources. In this manner, we develop a model for scattering by inhomogeneous films, with anisotropic correlation functions. The results are compared with Mueller matrix bidirectional scattering distribution function measurements for a glancing-angle deposition (GLAD) film. While the results are applied to the GLAD film example, the development of the theory is general enough that it can guide simulations for scattering in other anisotropic thin films.

Entities:  

Year:  2017        PMID: 29091646      PMCID: PMC5729762          DOI: 10.1364/JOSAA.34.001974

Source DB:  PubMed          Journal:  J Opt Soc Am A Opt Image Sci Vis        ISSN: 1084-7529            Impact factor:   2.129


  7 in total

1.  Polarized light scattering by microroughness and small defects in dielectric layers.

Authors:  T A Germer
Journal:  J Opt Soc Am A Opt Image Sci Vis       Date:  2001-06       Impact factor: 2.129

2.  Measurement of roughness of two interfaces of a dielectric film by scattering ellipsometry

Authors: 
Journal:  Phys Rev Lett       Date:  2000-07-10       Impact factor: 9.161

3.  Scatter from tilted-columnar birefringent thin films: observation and measurement of anisotropic scatter distributions.

Authors:  I J Hodgkinson; P I Bowmar; Q H Wu
Journal:  Appl Opt       Date:  1995-01-01       Impact factor: 1.980

4.  General and self-consistent method for the calibration of polarization modulators, polarimeters, and mueller-matrix ellipsometers.

Authors:  E Compain; S Poirier; B Drevillon
Journal:  Appl Opt       Date:  1999-06-01       Impact factor: 1.980

5.  Angular dependence and polarization of out-of-plane optical scattering from particulate contamination, subsurface defects, and surface microroughness.

Authors:  T A Germer
Journal:  Appl Opt       Date:  1997-11-20       Impact factor: 1.980

6.  Polarization of out-of-plane scattering from microrough silicon.

Authors:  T A Germer; C C Asmail; B W Scheer
Journal:  Opt Lett       Date:  1997-09-01       Impact factor: 3.776

7.  Electron-beam-deposited distributed polarization rotator for high-power laser applications.

Authors:  J B Oliver; T J Kessler; C Smith; B Taylor; V Gruschow; J Hettrick; B Charles
Journal:  Opt Express       Date:  2014-10-06       Impact factor: 3.894

  7 in total

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