| Literature DB >> 18188214 |
T A Germer, C C Asmail, B W Scheer.
Abstract
The polarization of light scattered by silicon with a small degree of microroughness was measured out of the plane of incidence. First-order vector perturbation theory for scattering from a rough surface predicts the behavior well. The data and the theory show Brewster-like angles where p?p scattering from surface microroughness vanishes, as well as a deterministic polarization in other directions.Entities:
Year: 1997 PMID: 18188214 DOI: 10.1364/ol.22.001284
Source DB: PubMed Journal: Opt Lett ISSN: 0146-9592 Impact factor: 3.776