Literature DB >> 18188214

Polarization of out-of-plane scattering from microrough silicon.

T A Germer, C C Asmail, B W Scheer.   

Abstract

The polarization of light scattered by silicon with a small degree of microroughness was measured out of the plane of incidence. First-order vector perturbation theory for scattering from a rough surface predicts the behavior well. The data and the theory show Brewster-like angles where p?p scattering from surface microroughness vanishes, as well as a deterministic polarization in other directions.

Entities:  

Year:  1997        PMID: 18188214     DOI: 10.1364/ol.22.001284

Source DB:  PubMed          Journal:  Opt Lett        ISSN: 0146-9592            Impact factor:   3.776


  1 in total

1.  Polarized optical scattering by inhomogeneities and surface roughness in an anisotropic thin film.

Authors:  Thomas A Germer; Katelynn A Sharma; Thomas G Brown; James B Oliver
Journal:  J Opt Soc Am A Opt Image Sci Vis       Date:  2017-11-01       Impact factor: 2.129

  1 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.