Literature DB >> 28966399

Key comparison BIPM.RI(I)-K3 of the air-kerma standards of the NIST, USA and the BIPM in medium-energy x-rays.

D T Burns1, C Kessler1, M O'Brien2, R Minniti2.   

Abstract

A key comparison has been made between the air-kerma standards of the NIST, USA and the BIPM in the medium-energy x-ray range. The results show the standards to be in agreement at the level of the standard uncertainty of the comparison of 3.8 parts in 103, except at 250 kV where the difference is 1.5 times the standard uncertainty. The results are analysed and presented in terms of degrees of equivalence, suitable for entry in the BIPM key comparison database.

Entities:  

Year:  2012        PMID: 28966399      PMCID: PMC5621609          DOI: 10.1088/0026-1394/49/1A/06006

Source DB:  PubMed          Journal:  Metrologia        ISSN: 0026-1394            Impact factor:   3.157


  3 in total

1.  Key comparison BIPM.RI(I)-K3 of the air-kerma standards of the NIST, USA and the BIPM in medium-energy x-rays.

Authors:  D T Burns; C Kessler; M O'Brien; R Minniti
Journal:  Metrologia       Date:  2012       Impact factor: 3.157

2.  Diaphragm correction factors for free-air chamber standards for air kerma in x-rays.

Authors:  D T Burns; C Kessler
Journal:  Phys Med Biol       Date:  2009-04-08       Impact factor: 3.609

3.  Comparison of the NIST and BIPM Standards for Air Kerma in Medium-Energy X-Rays.

Authors:  D T Burns; M O'Brien
Journal:  J Res Natl Inst Stand Technol       Date:  2006-10-01
  3 in total
  3 in total

1.  Key comparison BIPM.RI(I)-K3 of the air-kerma standards of the NIST, USA and the BIPM in medium-energy x-rays.

Authors:  D T Burns; C Kessler; M O'Brien; R Minniti
Journal:  Metrologia       Date:  2012       Impact factor: 3.157

2.  New National Air-Kerma Standard for Low-Energy Electronic Brachytherapy Sources.

Authors:  Stephen M Seltzer; Michelle O'Brien; Michael G Mitch
Journal:  J Res Natl Inst Stand Technol       Date:  2014-10-06

3.  Comparison of the NIST and PTB Air-Kerma Standards for Low-Energy X-Rays.

Authors:  Michelle O'Brien; Ludwig Bueermann
Journal:  J Res Natl Inst Stand Technol       Date:  2009-12-01
  3 in total

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