Literature DB >> 28757682

High-precision measurement of the X-ray Cu Kα spectrum.

Marcus H Mendenhall1, Albert Henins1, Lawrence T Hudson1, Csilla I Szabo2,1, Donald Windover1, James P Cline1.   

Abstract

The structure of the X-ray emission lines of the Cu Kα complex has been remeasured on a newly commissioned instrument, in a manner directly traceable to the Système Internationale definition of the meter. In this measurement, the region from 8000 eV to 8100 eV has been covered with a highly precise angular scale, and well-defined system efficiency, providing accurate wavelengths and relative intensities. This measurement updates the standard multi-Lorentzian-fit parameters from Härtwig, Hölzer, et al., and is in modest disagreement with their results for the wavelength of the Kα1 line when compared via quadratic fitting of the peak top; the intensity ratio of Kα1 to Kα2 agrees within the combined error bounds. However, the position of the fitted top of Kα1 is very sensitive to the fit parameters, so it is not believed to be a robust value to quote without further qualification. We also provide accurate intensity and wavelength information for the so-called Kα3,4 "satellite" complex. Supplementary data is provided which gives the entire shape of the spectrum in this region, allowing it to be used directly in cases where simplified, multi-Lorentzian fits to it are not sufficiently accurate.

Entities:  

Year:  2017        PMID: 28757682      PMCID: PMC5531297          DOI: 10.1088/1361-6455/aa6c4a

Source DB:  PubMed          Journal:  J Phys B At Mol Opt Phys        ISSN: 0953-4075            Impact factor:   1.917


  6 in total

1.  Detailed tabulation of atomic form factors, photoelectric absorption and scattering cross section, and mass attenuation coefficients in the vicinity of absorption edges in the soft X-ray (Z = 30-36, Z = 60-89, E = 0.1-10 keV)--addressing convergence issues of earlier work.

Authors:  C T Chantler
Journal:  J Synchrotron Radiat       Date:  2001-07-01       Impact factor: 2.616

2.  Theoretical determination of characteristic x-ray lines and the copper K alpha spectrum.

Authors:  C T Chantler; A C L Hayward; I P Grant
Journal:  Phys Rev Lett       Date:  2009-09-16       Impact factor: 9.161

3.  K alpha and K beta x-ray emission spectra of copper.

Authors: 
Journal:  Phys Rev A       Date:  1995-01       Impact factor: 3.140

4.  Description, performance, and wavelengths of iodine stabilized lasers.

Authors:  W G Schweitzer; E G Kessler; R D Deslattes; H P Layer; J R Whetstone
Journal:  Appl Opt       Date:  1973-12-01       Impact factor: 1.980

5.  Characterization of a self-calibrating, high-precision, stacked-stage, vertical dual-axis goniometer.

Authors:  Marcus H Mendenhall; Albert Henins; Donald Windover; James P Cline
Journal:  Metrologia       Date:  2016-04-11       Impact factor: 3.157

6.  X-Ray Spectrometry of Copper: New Results on an Old Subject.

Authors:  M Deutsch; E Förster; G Hölzer; J Härtwig; K Hämäläinen; C-C Kao; S Huotari; R Diamant
Journal:  J Res Natl Inst Stand Technol       Date:  2004-02-01
  6 in total
  4 in total

1.  The optics of focusing bent-crystal monochromators on X-ray powder diffractometers with application to lattice parameter determination and microstructure analysis.

Authors:  Marcus H Mendenhall; David Black; James P Cline
Journal:  J Appl Crystallogr       Date:  2019       Impact factor: 3.304

2.  The Molybdenum K-shell X-ray Emission Spectrum.

Authors:  Marcus H Mendenhall; Lawrence T Hudson; Csilla I Szabo; Albert Henins; James P Cline
Journal:  J Phys B At Mol Opt Phys       Date:  2019       Impact factor: 1.917

3.  Contemporary x-ray wavelength metrology and traceability.

Authors:  L T Hudson; J P Cline; A Henins; M H Mendenhall; C I Szabo
Journal:  Radiat Phys Chem Oxf Engl 1993       Date:  2019-07-03       Impact factor: 2.858

4.  On the Importance of Electron Diffusion in a Bulk-Matter Test of the Pauli Exclusion Principle.

Authors:  Edoardo Milotti; Sergio Bartalucci; Sergio Bertolucci; Massimiliano Bazzi; Mario Bragadireanu; Michael Cargnelli; Alberto Clozza; Catalina Curceanu; Luca De Paolis; Jean-Pierre Egger; Carlo Guaraldo; Mihail Iliescu; Matthias Laubenstein; Johann Marton; Marco Miliucci; Andreas Pichler; Dorel Pietreanu; Kristian Piscicchia; Alessandro Scordo; Hexi Shi; Diana Laura Sirghi; Florin Sirghi; Laura Sperandio; Oton Vázquez Doce; Eberhard Widmann; Johann Zmeskal
Journal:  Entropy (Basel)       Date:  2018-07-09       Impact factor: 2.524

  4 in total

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