| Literature DB >> 27458542 |
Xiaonan L Liu1, Lynne M Reder2.
Abstract
INTRODUCTION: The testing effect refers to superior retention when study is followed by a test rather than followed by another study. Most research to date on why the testing effect occurs has been behavioral, but we employed neuroimaging methods in this study in order to shed light on the underlying processes.Entities:
Keywords: Encoding; fMRI; retrieval; subsequent memory effect; testing effect
Mesh:
Year: 2016 PMID: 27458542 PMCID: PMC4875931 DOI: 10.1002/brb3.476
Source DB: PubMed Journal: Brain Behav Impact factor: 2.708
Figure 1Illustration of the three treatment conditions for word pairs on a given list. Phases 1, 2, and 3 occurred in the scanner on Day 1. Phase 4 was administered outside of the scanner on Day 2.
Mean accuracy of all trials and of trials following correct test(s), mean correct RTs, and mean number of items correctly recalled for each phase of experiment.a
| Phase | Condition | All trials | Trials following correct test(s) | Mean RTs for correct trials (sec) | Number of correct trials |
|---|---|---|---|---|---|
| Phase 2 | STT‐T | 0.59 (0.05) | 4.77 (0.14) | 40 | |
| Phase 3 | STT‐T | 0.45 (0.05) | 0.76 (0.04) | 4.11 (0.21) | 31 |
| SST‐T | 0.58 (0.05) | 4.52 (0.17) | 26 | ||
| Phase 4 | STT‐T | 0.36 (0.06) | 0.80 (0.03) | 4.09 (0.12) | 24 |
| SST‐T | 0.43 (0.06) | 0.74 (0.04) | 4.01 (0.16) | 19 | |
| SSS‐T | 0.54 (0.06) | 4.45 (0.19) | 13 |
RTs, reaction time.
Standard errors are shown in parentheses.
Number of correct trials at Phase 2 and Phase 3 are also the number of trials included in fMRI analyses. Note that the number of trials per condition is not a pure measure of accuracy because the number of trials was not balanced initially (see the Materials section).
Figure 2Subsequent memory effect (beta values of ROIs for subsequently correct trials minus these for subsequently incorrect trials) for the first test in the SST‐T condition versus the second test in the STT‐T condition. For the first test, significant or marginally significant subsequent memory effects were observed in all six ROIs (left PFC, t 18 = 4.69, P < 0.001, d = 1.08; right PFC, t 18 = 2.64, P = 0.017, d = 0.61; left PPC, t 18 = 2.85, P = 0.011, d = 0.67; right PPC, t 18 = 3.12, P = 0.006, d = 0.72; left HPC, t 18 = 1.87, P = 0.078, d = 0.43; right HPC, t 18 = 2.17, P = 0.044, d = 0.50). For the second test, significant subsequent memory effects were observed in right HPC (t 18 = 2.92, P = 0.009, d = 0.66), right PFC (t 18 = 2.33, P = 0.032, d = 0.54), and right PPC (t 18 = 2.36, P = 0.03, d = 0.54). The left PFC showed a subsequent failure effect (t 18 = 3.11, P = 0.006, d = 0.71). HPC, hippocampus; PFC, prefrontal cortex; PPC, posterior parietal cortex; ROI, regions of interest.
Figure 3Subsequent memory effect (parameter estimates of regions of interests for subsequently correct trials minus these for subsequently incorrect trials) for recall at Phase 2 in the STT‐T condition (testing effect at short interval) and at Phase 3 in the SST‐T condition (testing effect at long interval). The subsequent memory effect was larger for the long‐delay condition compared to the short‐delay condition in left prefrontal cortex (t 18 = 2.28, P = 0.035, d = 0.57).
Regions showing subsequent memory/failure effects in each testing condition in the exploratory analyses
| Regions | L/R | BA | MNI coordinates |
| Cluster | ||
|---|---|---|---|---|---|---|---|
| Subsequent memory effect of initial study | |||||||
| Inferior temporal gyrus | L | 37 | −48 | −60 | −15 | 6.77 | 14 |
| L | 20 | −54 | −51 | −15 | 5.31 | ||
| Inferior frontal gyrus | L | 46 | −51 | 27 | 21 | 5.92 | 10 |
| Precentral gyrus | L | 44 | −45 | 6 | 9 | 5.20 | 16 |
| L | 6 | −51 | −3 | 9 | 3.69 | ||
| Subsequent memory effect of the first test in the STT‐T condition | |||||||
| Superior temporal gyrus | L | 13 | −42 | −48 | 24 | 6.32 | 10 |
| 13 | −48 | −48 | 18 | 5.88 | |||
| Superior temporal gyrus | L | 22 | −66 | −42 | 18 | 6.26 | 12 |
| Cuneus | L | 19 | −30 | −87 | 30 | 6.1 | 15 |
| 18 | −21 | −81 | 24 | 5.78 | |||
| Middle frontal gyrus | R | 46 | 51 | 30 | 21 | 6.6 | 48 |
| Middle frontal gyrus | R | 6 | 39 | 6 | 42 | 5.88 | 30 |
| 9 | 45 | 9 | 36 | 5.72 | |||
| Inferior parietal lobule | R | 40 | 45 | −36 | 39 | 6.48 | 47 |
| 40 | 39 | −33 | 33 | 5.98 | |||
| 40 | 42 | −42 | 30 | 5.38 | |||
| Precuneus | R | 7 | 21 | −66 | 51 | 6.08 | 17 |
| Superior parietal lobule | R | 7 | 33 | −63 | 51 | 5.8 | 22 |
| Parahippocampal gyrus | R | 27 | 21 | −30 | −6 | 6.26 | 11 |
| Subsequent memory effect of the first test in the SST‐T condition | |||||||
| Middle frontal gyrus | L | 9 | −54 | 18 | 33 | 9.82 | 72 |
| 9 | −45 | 15 | 33 | 8.55 | |||
| 46 | −42 | 24 | 18 | 7.45 | |||
| Precentral gyrus | L | 6 | −18 | −18 | 66 | 9.67 | 27 |
| Precuneus | L | 19 | −30 | −63 | 39 | 7.89 | 29 |
| Inferior parietal lobule | L | 40 | −33 | −45 | 45 | 6.73 | 42 |
| 40 | −48 | −45 | 42 | 6.52 | |||
| Precentral gyrus | R | 6 | 51 | −3 | 18 | 7.05 | 39 |
| 6 | 42 | −6 | 27 | 6.86 | |||
| 44 | 51 | 3 | 12 | 6.29 | |||
| Subsequent memory effect of the second test in the STT‐T condition | |||||||
| Medial frontal gyrus | R | 6 | 3 | 14 | 46 | 6.70 | 18 |
| Middle frontal gyrus | R | 6 | 24 | −1 | 44 | 5.59 | 24 |
| 6 | 36 | −1 | 39 | 5.79 | |||
| 6 | 33 | 5 | 47 | 5.13 | |||
| Middle frontal gyrus | R | 6 | 33 | −9 | 47 | 6.82 | 53 |
| 6 | 53 | 2 | 41 | 6.22 | |||
| 4 | 48 | −6 | 47 | 5.88 | |||
| Medial frontal gyrus | R | 6 | 15 | 3 | 52 | 6.49 | 17 |
| Superior frontal gyrus | R | 10 | 21 | 47 | −2 | 6.19 | 10 |
| Postcentral gyrus | R | 2 | 36 | −35 | 60 | 7.06 | 34 |
| 3 | 42 | −26 | 57 | 5.98 | |||
| Subsequent failure effect of the second test in the STT‐T condition | |||||||
| Inferior frontal gyrus | L | 45 | −48 | 21 | 15 | 9.96 | 50 |
| 45 | −54 | 21 | 6 | 7.24 | |||
| Inferior parietal lobule | L | 40 | −45 | −45 | 42 | 7.52 | 21 |
| 40 | −54 | −48 | 51 | 6.14 | |||
MNI, Montreal Neurological Institute.
Figure 4Subsequent memory/failure effects. (A) The subsequent memory effect of the first test in the STT‐T condition. (B) The subsequent memory effect of the first test in the SST‐T condition. (C) The subsequent memory effect of the second test in the STT‐T condition. (D) The subsequent failure effect of the second test in the STT‐T condition.