| Literature DB >> 25671162 |
Toma Susi1, Thomas Pichler1, Paola Ayala1.
Abstract
X-ray photoelectron spectroscopy (XPS) is one of the best tools for studying the chemicclass="Chemical">al modificatioclass="Chemical">n of surfaces, aclass="Chemical">nd iclass="Chemical">n partiEntities:
Keywords: X-ray photoelectron spectroscopy (XPS); carbon nanotubes; core level photoemission; graphene; substitutional doping
Year: 2015 PMID: 25671162 PMCID: PMC4311644 DOI: 10.3762/bjnano.6.17
Source DB: PubMed Journal: Beilstein J Nanotechnol ISSN: 2190-4286 Impact factor: 3.649
Figure 1Structural models of graphitic carbon nanomaterials. Clockwise from top left: graphene, graphite, C60 fullerene, and a single-walled carbon nanotube.
Photoemission measurements of the carbon 1s line for various graphitic carbon nanomaterials reported in the literature. The columns show the material, position of the maximum of the carbon 1s response, the energy width of the Lorentzian/Gaussian component, or, the full width at half maximum if these contributions have not been separated, the asymmetry index α, and the literature citation for each measurement.
| material | C 1s max. (eV) | L/G width (eV) | FWHM (eV) | asymm. α | references |
| graphite (G) | 284.42 | 0.16–0.18/0.08–0.1 | — | 0.05–0.065 | [ |
| G(0001) bulk | 284.4a | 0.095/0.294 | — | 0.10 | [ |
| G(0001) surface | 284.6b | 0.231/0.294 | — | 0.05 | [ |
| G(0001) bulk | 284.4c | 0.16/0.06 | — | 0.048 | [ |
| G(0001) surface | 284.52d | 0.16/0.06 | — | 0.048 | [ |
| FLGe | 284.47 | — | 0.7 | 0.1 | [ |
| SLG/Ni(111) | 284.7 | 0.216 | — | 0.1 | [ |
| SLG/Au/Ni(111) | 284.2 | — | — | — | [ |
| SLG/Au/Ni(111) | 284.42 | 0.155/0.258 | — | 0.061 | [ |
| SLG/Cu | 284.5 | 0.170 | — | 0.068 | [ |
| SLG/SiC | 284.83 | 0.12–0.2/0.4–0.7 | — | —/0f | [ |
| SLG/H/SiC | 284.6 | — | — | — | [ |
| SLG/Pt(111) | 283.97 | 0.13/0.34 | — | 0.13 | [ |
| 4LG/Pt(111) | 284.0 | — | — | — | [ |
| SLG/Ir(111) | 284.15 | 0.130/0.165 | — | 0.093 | [ |
| m-SWCNTg | 284.48 | — | 0.26 | 0.11 | [ |
| s-SWCNTg | 284.43 | — | 0.30 | 0 | [ |
| (6,5) s-SWCNT | 284.52 | — | 0.41 | 0 | [ |
| (6,4) s-SWCNT | 284.42 | — | 0.41 | 0 | [ |
| DWCNT | 284.6 | — | 0.64–0.8 | 0 | [ |
| MWCNT | 284.42 | — | —h | [ | |
| C60 | 285.2 | 0.11/0.60 | — | 0 | [ |
aValue not explicitly reported, estimated from graph. bBulk value not explicitly reported, 195 meV split between the lines attributed to bulk and surface components. cValue not explicitly reported, estimated from graph. dBulk value not explicitly reported, 120 meV split between the lines attributed to bulk and surface components. eSynchrotron-based scanning X-ray photoelectron microscopy measurements on suspended few-layer graphene. fEither not reported or symmetric line shapes used in the fitting. gMetallicity separated sample with narrow diameter distributions centered at 1.4 nm. hValue not explicitly reported, but remarked to be similar to graphite.
Figure 2The photoemission response of metallicity-separated and purified single-walled carbon nanotube buckypapers. (a) C 1s photoemission of metallic (red upper curve) and semiconducting (blue lower curve) SWCNTs measured with a 400 eV photon excitation. The inset shows a survey scan, demonstrating the purity of the samples. (b) An expanded view of the C 1s line. The response of the metallic sample has been fitted with a Doniach–Šunjić and the semiconducting with a Voigtian lineshape. Reproduced with permission from [37], copyright 2009 The American Physical Society.
XPS measurements of the carbon 1s and nitrogen 1s lines for various nitrogen-doped graphitic carbon nanomaterials reported in the literature. The columns show the material, diameter of the nanostructure, the carbon 1s energy assigned to C–C bonds, and to C–N bonds, the nitrogen 1s energies assigned to pyridinic (pnic), pyrrolic (plic) and substitutional (subs) nitrogen, the concentration of nitrogen in atomic percent, and the citation for each measurement.
| C 1s (eV) | N 1s (eV) | |||||||
| material | C–C | C–Na | pnic | plic | subs | N atomic % | references | |
| (C59N)2 | 0.71 | 285.2 | — | — | — | 400.72 | 1.6 | [ |
| SW | 1–1.6 | 284.5 | — | 398.5 | — | 400.6 | 0.3 | [ |
| SW | <2 | 284.8 | 286.3, 288.3 | 399.8 | — | 401.8 | 3 | [ |
| SW | 1–1.8 | 284.7b | 287 | 397.9 | — | 401.1 | 2 | [ |
| SW | 1.1–1.2 | — | — | 398.6 | — | 400.5 | 1.1 | [ |
| SW | 0.9–1.8 | — | — | 397.6 | — | 400.5 | 1 | [ |
| SW | 0.8–1.0 | 284.5 | 285.8, 287 | 398.4 | 400.9 | — | 3.2 | [ |
| S/DW | 0.8–2 | 284.5 | — | 398.6 | — | 400.6 | 0.2 | [ |
| DW | — | 284.5 | 285.5 | 398.3 | — | 400.2 | 3 | [ |
| DW | 1.6–3.2 | 284.3 | — | 398.0 | — | 401.3 | 1 | [ |
| FW | 1–5 | 284.5 | 287 | 398.6 | — | 400.88 | 6 | [ |
| MW | 15–80 | 284.5 | 285.5 | 398.4 | — | 400.2 | 8 | [ |
| MW | 10–40 | 284.7 | 285.7 ± 0.1 | 398.5 | — | 400.8 | 4 | [ |
| MW | 30–80 | 284.5 | — | 398.6 | — | 400.5 | 5 | [ |
| MW | 30–60 | 284.5 | — | 398.2 | — | 400.5 | 25.7 | [ |
| MW | 20–60 | 284.1 | 285.9 | 398.2 | 400.2 | 401.1 | 5.2 | [ |
| SLG/Cu | ∞ | 284.8 | 285.8, 287.5 | 398.2 | 400.1 | 401.7 | 8.9 | [ |
| SLG/Au/Ni(111)d | ∞ | 284.4 | — | 398.4 | 400.3 | 401.3 | 0.48 | [ |
| SLG/Cu | ∞ | 284.6 | 285.8 | 398.6 | — | 400.6 | 0.25 | [ |
| SLG/SiO2 | ∞ | 284.5 | — | 398.0 | 398.9 | 400 | 0.4 | [ |
| FLG | ∞ | 284.6f | — | 398.45 | 399.45 | 400.92 | 12.8 | [ |
| graphite | ∞ | — | — | 398.5 | 399.9 | 401.1 | 2.7 | [ |
aWhen two values are listed, the lower binding energy component has been assigned to sp2 C–N and the higher to sp3 C–N bonds. bShifted from 284.5 eV upon doping. cPredominant presence of graphitic nitrogen subsequently verified by transmission electron microscopy [145–146]. dQuasi-freestanding graphene via Au intercalation as in [69–70]. eMost values not explicitly reported, estimated from spectrum graph. A slight C 1s downshift and broadening is observed in the doped sample. fSynchrotron-based scanning X-ray photoelectron microscopy measurements on ion-implanted few-layer graphene samples. The pristine sample was measured at 284.47 eV.
Figure 3An XPS measurement and peak assignment of nitrogen-doped graphene prepared by chemical vapor deposition. (a–c) N 1s and C 1s spectra of N-graphene freshly prepared on nickel, intercalated by gold, and treated by post-annealing. Note the large shifts caused by interaction with the substrate in the non-intercalated spectrum. The N 1s spectra shown in (b) have been background-subtracted. In the post-annealed sample, a peak at 401.3 eV was assigned to graphitic nitrogen, and another at 398.4 eV to pyridinic N. (d) Some proposed possible configurations of graphene nitrogen impurities: (1) graphitic (substitutional) N; three varieties of pyridinic bonding: (2) edge pyridinic N, (3) single N pyridinic vacancy (1NV), and (4) triple N pyridinic vacancy (3NV); (5) pyrrole-like N, (6) interstitial N or adatom, and (7) amine or (8) nitrile groups. Adapted with permission from [127], copyright 2011 The American Chemical Society.