| Literature DB >> 23984191 |
Shuchen Hsieh1, Shu-Ling Hsieh, Chiung-Wen Hsieh, Po-Chiao Lin, Chun-Hsin Wu.
Abstract
Efficient maintenance of glucose homeostasis is a major challenge in diabetes therapy, where accurate and reliable glucose level detection is required. Though several methods are currently used, these suffer from impaired response and often unpredictable drift, making them unsuitable for long-term therapeutic practice. In this study, we demonstrate a method that uses a functionalized atomic force microscope (AFM) cantilever as the sensor for reliable glucose detection with sufficient sensitivity and selectivity for clinical use. We first modified the AFM tip with aminopropylsilatrane (APS) and then adsorbed glucose-specific lectin concanavalin A (Con A) onto the surface. The Con A/APS-modified probes were then used to detect glucose by monitoring shifts in the cantilever resonance frequency. To confirm the molecule-specific interaction, AFM topographical images were acquired of identically treated silicon substrates which indicated a specific attachment for glucose-Con A and not for galactose-Con A. These results demonstrate that by monitoring the frequency shift of the AFM cantilever, this sensing system can detect the interaction between Con A and glucose, one of the biomolecule recognition processes, and may assist in the detection and mass quantification of glucose for clinical applications with very high sensitivity.Entities:
Year: 2013 PMID: 23984191 PMCID: PMC3747413 DOI: 10.1155/2013/687265
Source DB: PubMed Journal: J Anal Methods Chem ISSN: 2090-8873 Impact factor: 2.193
Figure 1Schematic drawing of the cantilever modification procedure glucose detection by attachment.
Figure 2Cantilever frequency shifts at each step in the cantilever modification process for (a) glucose and (b) galactose. The symbols (■, ○, and ★) represent APS, APS/Con A, and APS/Con A/glucose or galactose, respectively.
Figure 3Topographic images (height data) (a, d) of an APS-modified silicon surface. Topographic images (b, e) of a Con A/APS/Si wafer. Upper right hand corner shows the surface roughness of the scanned area. Images (c) and (f) show the Con A/APS/Si wafer after exposure to glucose and galactose, respectively. The glucose-exposed surface exhibits a significantly modified topography, while no change is observed for the sample exposed to galactose. All images are 5 × 5 μm2.