Literature DB >> 23187408

Noise models for low counting rate coherent diffraction imaging.

Pierre Godard1, Marc Allain, Virginie Chamard, John Rodenburg.   

Abstract

Coherent diffraction imaging (CDI) is a lens-less microscopy method that extracts the complex-valued exit field from intensity measurements alone. It is of particular importance for microscopy imaging with diffraction set-ups where high quality lenses are not available. The inversion scheme allowing the phase retrieval is based on the use of an iterative algorithm. In this work, we address the question of the choice of the iterative process in the case of data corrupted by photon or electron shot noise. Several noise models are presented and further used within two inversion strategies, the ordered subset and the scaled gradient. Based on analytical and numerical analysis together with Monte-Carlo studies, we show that any physical interpretations drawn from a CDI iterative technique require a detailed understanding of the relationship between the noise model and the used inversion method. We observe that iterative algorithms often assume implicitly a noise model. For low counting rates, each noise model behaves differently. Moreover, the used optimization strategy introduces its own artefacts. Based on this analysis, we develop a hybrid strategy which works efficiently in the absence of an informed initial guess. Our work emphasises issues which should be considered carefully when inverting experimental data.

Mesh:

Year:  2012        PMID: 23187408     DOI: 10.1364/OE.20.025914

Source DB:  PubMed          Journal:  Opt Express        ISSN: 1094-4087            Impact factor:   3.894


  16 in total

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Journal:  Opt Express       Date:  2019-06-24       Impact factor: 3.894

2.  Revealing crystalline domains in a mollusc shell single-crystalline prism.

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3.  High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography.

Authors:  S O Hruszkewycz; M Allain; M V Holt; C E Murray; J R Holt; P H Fuoss; V Chamard
Journal:  Nat Mater       Date:  2016-11-21       Impact factor: 43.841

4.  Nanoscale x-ray imaging of circuit features without wafer etching.

Authors:  Junjing Deng; Young Pyo Hong; Si Chen; Youssef S G Nashed; Tom Peterka; Anthony J F Levi; John Damoulakis; Sayan Saha; Travis Eiles; Chris Jacobsen
Journal:  Phys Rev B       Date:  2017-03-24       Impact factor: 4.036

5.  Wide field-of-view fluorescence image deconvolution with aberration-estimation from Fourier ptychography.

Authors:  Jaebum Chung; Jinho Kim; Xiaoze Ou; Roarke Horstmeyer; Changhuei Yang
Journal:  Biomed Opt Express       Date:  2016-01-07       Impact factor: 3.732

6.  Solving ptychography with a convex relaxation.

Authors:  Roarke Horstmeyer; Richard Y Chen; Xiaoze Ou; Brendan Ames; Joel A Tropp; Changhuei Yang
Journal:  New J Phys       Date:  2015-05       Impact factor: 3.729

7.  Efficient ptychographic phase retrieval via a matrix-free Levenberg-Marquardt algorithm.

Authors:  Saugat Kandel; S Maddali; Youssef S G Nashed; Stephan O Hruszkewycz; Chris Jacobsen; Marc Allain
Journal:  Opt Express       Date:  2021-07-19       Impact factor: 3.833

8.  Adorym: a multi-platform generic X-ray image reconstruction framework based on automatic differentiation.

Authors:  Ming Du; Saugat Kandel; Junjing Deng; Xiaojing Huang; Arnaud Demortiere; Tuan Tu Nguyen; Remi Tucoulou; Vincent De Andrade; Qiaoling Jin; Chris Jacobsen
Journal:  Opt Express       Date:  2021-03-29       Impact factor: 3.894

9.  Fly-scan ptychography.

Authors:  Xiaojing Huang; Kenneth Lauer; Jesse N Clark; Weihe Xu; Evgeny Nazaretski; Ross Harder; Ian K Robinson; Yong S Chu
Journal:  Sci Rep       Date:  2015-03-13       Impact factor: 4.379

10.  Coherent imaging at the diffraction limit.

Authors:  Pierre Thibault; Manuel Guizar-Sicairos; Andreas Menzel
Journal:  J Synchrotron Radiat       Date:  2014-08-27       Impact factor: 2.616

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