| Literature DB >> 22953196 |
Hye-Eun Lee1, Eun-A Kim, Jungsun Park, Seong-Kyu Kang.
Abstract
OBJECTIVES: The purpose of this study was to evaluate cancer risks in the Korean semiconductor industry.Entities:
Keywords: Cancer; Cohort studies; Leukemia; Lymphoma; Semiconductors
Year: 2011 PMID: 22953196 PMCID: PMC3431897 DOI: 10.5491/SHAW.2011.2.2.135
Source DB: PubMed Journal: Saf Health Work ISSN: 2093-7911
Number of subjects by selected characteristics for mortality and incidence analysis
*The total might be less or more than the sum of the number of employees at each stratum because there were workers who were classified into more than one stratum or classified as unknown.
†Six persons of the cases in incidence analysis had double primary cancers.
Observed number of deaths of specific types of cancer, SMRs and 95% confidence interval
Obs: observed, SMR: standardized mortality ratio, CI: confidence interval.
Observed number of cases of specific types of cancer, SIRs and 95% confidence interval
Obs: observed, SIR: standardized incidence ratio, CI: confidence interval.
*Statistically significant at the 2-sided 5% level of significance.
Leukemia (C91-C95) incidence : numbers and SIRs by selected subgroups
Obs: observed, SIR: standardized incidence ratio, CI: confidence interval, FAB: fabrication.
*The total might be less or more than the sum of the number of cases at each stratum because there were workers who were classified into more than one stratum or classified as unknown.
Non-Hodgkin's lymphoma (C81-C85) incidence : numbers and SIRs by selected subgroups
Obs: observed, SIR: standardized incidence ratio, CI: confidence interval, FAB: fabrication.
*Statistically significant at the 2-sided 5% level of significance.
†The total might be less or more than the sum of the number of cases at each stratum because there were workers who were classified into more than one stratum or classified as unknown.
Thyroid cancer (C73) incidence : numbers and SIRs by selected subgroup
Obs: observed, SIR: standardized incidence ratio, CI: confidence interval, FAB: fabrication.
*Statistically significant at the 2-sided 5% level of significance.
†The total might be less or more than the sum of the number of cases at each stratum because there were workers who were classified into more than one stratum or classified as unknown.