Literature DB >> 16217241

Mortality among semiconductor and storage device-manufacturing workers.

Colleen Beall1, Thomas J Bender, Hong Cheng, Robert Herrick, Amy Kahn, Robert Matthews, Nalini Sathiakumar, Maria Schymura, James Stewart, Elizabeth Delzell.   

Abstract

PROBLEM: We evaluated mortality during 1965 to 1999 among 126,836 workers at two semiconductor facilities and one storage device facility.
METHOD: We compared employees' cause-specific mortality rates with general population rates and examined mortality patterns by facility, duration of employment, time since first employment, and work activity.
RESULTS: Employees had lower-than-expected mortality overall (6579 observed deaths, standardized mortality ratio [SMR] = 65; 95% confidence interval [CI] = 64-67), for all cancers combined (2159 observed, SMR = 78, 95% CI = 75-81) and for other major diseases. Central nervous system cancer was associated with process equipment maintenance at one of the semiconductor facilities (10 observed, SMR = 247, 95% CI = 118-454). Prostate cancer was associated with facilities/laboratories at the storage device facility (18 observed, SMR = 198, (5% CI = 117-313).
CONCLUSIONS: Further evaluation of workplace exposures or independent investigations of similar occupational groups may clarify the interpretation of associations observed in this study.

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Mesh:

Year:  2005        PMID: 16217241     DOI: 10.1097/01.jom.0000183094.42763.f0

Source DB:  PubMed          Journal:  J Occup Environ Med        ISSN: 1076-2752            Impact factor:   2.162


  19 in total

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2.  Cancer incidence among semiconductor and electronic storage device workers.

Authors:  T J Bender; C Beall; H Cheng; R F Herrick; A R Kahn; R Matthews; N Sathiakumar; M J Schymura; J H Stewart; E Delzell
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9.  Quantitative exposure assessment of various chemical substances in a wafer fabrication industry facility.

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10.  Cases series of malignant lymphohematopoietic disorder in korean semiconductor industry.

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