Literature DB >> 22807821

4-Chloro-anilinium thio-cyanate.

Siti Fairus M Yusoff1, F Salem Halima, Bohari M Yamin.   

Abstract

In the title compound, C(6)H(7)ClN(+)·NCS(-), the benzene ring and the protonated amine and chloro substituents are nearly planar, with a maximum deviation of 0.002 (2) Å for the N atom. In the crystal, the mol-ecules are linked by N-H⋯N and N-H⋯S hydrogen bonds into a chain along the b axis.

Entities:  

Year:  2012        PMID: 22807821      PMCID: PMC3393264          DOI: 10.1107/S160053681202377X

Source DB:  PubMed          Journal:  Acta Crystallogr Sect E Struct Rep Online        ISSN: 1600-5368


Related literature

For bond-length data see: Allen et al. (1987 ▶) and for a description of the Cambridge Structural Database, see: Allen (2002 ▶). For related thio­cyanate structures, see: Salem et al. (2012 ▶); Selvakumaran et al. (2011 ▶); Khawar Rauf et al. (2008 ▶).

Experimental

Crystal data

C6H7ClNNCS M = 186.66 Orthorhombic, a = 7.743 (2) Å b = 7.199 (2) Å c = 31.913 (10) Å V = 1778.8 (10) Å3 Z = 8 Mo Kα radiation μ = 0.60 mm−1 T = 298 K 0.50 × 0.43 × 0.30 mm

Data collection

Bruker SMART APEX CCD area-detector diffractometer Absorption correction: multi-scan (SADABS; Bruker, 2000 ▶) T min = 0.754, T max = 0.841 10422 measured reflections 1846 independent reflections 1628 reflections with I > 2σ(I) R int = 0.024

Refinement

R[F 2 > 2σ(F 2)] = 0.039 wR(F 2) = 0.108 S = 1.18 1846 reflections 112 parameters 3 restraints H atoms treated by a mixture of independent and constrained refinement Δρmax = 0.31 e Å−3 Δρmin = −0.19 e Å−3 Data collection: SMART (Bruker, 2000 ▶); cell refinement: SAINT (Bruker, 2000 ▶); data reduction: SAINT; program(s) used to solve structure: SHELXS97 (Sheldrick, 2008 ▶); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008 ▶); molecular graphics: SHELXTL (Sheldrick, 2008 ▶); software used to prepare material for publication: SHELXTL, PARST (Nardelli, 1995 ▶) and PLATON (Spek, 2009 ▶). Crystal structure: contains datablock(s) global, I. DOI: 10.1107/S160053681202377X/bq2362sup1.cif Structure factors: contains datablock(s) I. DOI: 10.1107/S160053681202377X/bq2362Isup2.hkl Supplementary material file. DOI: 10.1107/S160053681202377X/bq2362Isup3.cml Additional supplementary materials: crystallographic information; 3D view; checkCIF report
C6H7ClN+·NCSF(000) = 768
Mr = 186.66Dx = 1.394 Mg m3
Orthorhombic, PbcaMo Kα radiation, λ = 0.71073 Å
Hall symbol: -P 2ac 2abCell parameters from 4443 reflections
a = 7.743 (2) Åθ = 1.2–26.5°
b = 7.199 (2) ŵ = 0.60 mm1
c = 31.913 (10) ÅT = 298 K
V = 1778.8 (10) Å3Slab, colourless
Z = 80.50 × 0.43 × 0.30 mm
Bruker SMART APEX CCD area-detector diffractometer1846 independent reflections
Radiation source: fine-focus sealed tube1628 reflections with I > 2σ(I)
Graphite monochromatorRint = 0.024
Detector resolution: 83.66 pixels mm-1θmax = 26.5°, θmin = 1.2°
ω scanh = −5→9
Absorption correction: multi-scan (SADABS; Bruker, 2000)k = −9→8
Tmin = 0.754, Tmax = 0.841l = −38→40
10422 measured reflections
Refinement on F2Primary atom site location: structure-invariant direct methods
Least-squares matrix: fullSecondary atom site location: difference Fourier map
R[F2 > 2σ(F2)] = 0.039Hydrogen site location: inferred from neighbouring sites
wR(F2) = 0.108H atoms treated by a mixture of independent and constrained refinement
S = 1.18w = 1/[σ2(Fo2) + (0.0501P)2 + 0.6879P] where P = (Fo2 + 2Fc2)/3
1846 reflections(Δ/σ)max < 0.002
112 parametersΔρmax = 0.31 e Å3
3 restraintsΔρmin = −0.19 e Å3
Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.
Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.
xyzUiso*/Ueq
Cl10.41886 (10)0.01916 (11)0.749321 (18)0.0681 (2)
S10.66687 (7)0.20120 (7)0.468838 (17)0.04316 (18)
N10.5614 (2)0.1442 (3)0.56935 (6)0.0404 (4)
H1A0.6668 (16)0.111 (4)0.5642 (7)0.048 (7)*
H1B0.550 (3)0.2589 (17)0.5623 (8)0.062 (8)*
H1C0.490 (3)0.082 (4)0.5539 (7)0.068 (8)*
N20.4214 (2)0.4537 (3)0.43930 (7)0.0510 (5)
C10.4128 (3)0.2283 (4)0.63414 (7)0.0581 (6)
H10.35760.32410.61990.070*
C20.3805 (4)0.1992 (4)0.67630 (8)0.0638 (7)
H20.30380.27570.69060.077*
C30.4620 (3)0.0576 (3)0.69664 (6)0.0446 (5)
C40.5754 (3)−0.0562 (3)0.67624 (7)0.0561 (6)
H40.6301−0.15240.69040.067*
C50.6076 (3)−0.0262 (3)0.63414 (7)0.0526 (6)
H50.6847−0.10230.61980.063*
C60.5263 (2)0.1152 (3)0.61366 (6)0.0363 (4)
C70.5235 (3)0.3494 (3)0.45172 (6)0.0367 (4)
U11U22U33U12U13U23
Cl10.0875 (5)0.0781 (5)0.0387 (3)−0.0028 (4)0.0118 (3)0.0012 (3)
S10.0390 (3)0.0415 (3)0.0490 (3)0.0027 (2)0.0001 (2)0.0058 (2)
N10.0408 (10)0.0419 (10)0.0387 (9)−0.0012 (8)−0.0013 (8)0.0028 (7)
N20.0441 (10)0.0450 (10)0.0639 (12)0.0019 (9)−0.0057 (9)0.0067 (9)
C10.0664 (16)0.0605 (14)0.0473 (13)0.0269 (13)−0.0001 (11)0.0027 (11)
C20.0710 (16)0.0712 (16)0.0491 (13)0.0305 (14)0.0105 (12)−0.0039 (12)
C30.0497 (12)0.0505 (12)0.0338 (9)−0.0063 (10)0.0016 (9)−0.0028 (9)
C40.0690 (16)0.0528 (13)0.0465 (12)0.0168 (12)0.0043 (11)0.0104 (10)
C50.0606 (14)0.0531 (13)0.0440 (12)0.0189 (11)0.0098 (10)0.0047 (10)
C60.0354 (9)0.0366 (10)0.0368 (10)−0.0023 (8)−0.0018 (8)−0.0012 (7)
C70.0372 (10)0.0338 (9)0.0392 (10)−0.0066 (8)0.0024 (8)−0.0005 (8)
Cl1—C31.736 (2)C1—H10.9300
S1—C71.634 (2)C2—C31.363 (3)
N1—C61.455 (3)C2—H20.9300
N1—H1A0.866 (10)C3—C41.365 (3)
N1—H1B0.860 (10)C4—C51.384 (3)
N1—H1C0.868 (10)C4—H40.9300
N2—C71.160 (3)C5—C61.364 (3)
C1—C61.365 (3)C5—H50.9300
C1—C21.385 (4)
C6—N1—H1A108.8 (16)C2—C3—Cl1119.39 (18)
C6—N1—H1B111.9 (19)C4—C3—Cl1119.33 (18)
H1A—N1—H1B108 (3)C3—C4—C5119.0 (2)
C6—N1—H1C110.9 (19)C3—C4—H4120.5
H1A—N1—H1C111 (3)C5—C4—H4120.5
H1B—N1—H1C107 (3)C6—C5—C4119.9 (2)
C6—C1—C2119.4 (2)C6—C5—H5120.1
C6—C1—H1120.3C4—C5—H5120.1
C2—C1—H1120.3C5—C6—C1120.9 (2)
C3—C2—C1119.5 (2)C5—C6—N1119.10 (18)
C3—C2—H2120.3C1—C6—N1120.02 (19)
C1—C2—H2120.3N2—C7—S1179.5 (2)
C2—C3—C4121.3 (2)
C6—C1—C2—C3−0.3 (4)C3—C4—C5—C6−0.1 (4)
C1—C2—C3—C40.2 (4)C4—C5—C6—C10.0 (4)
C1—C2—C3—Cl1−179.0 (2)C4—C5—C6—N1−179.8 (2)
C2—C3—C4—C50.1 (4)C2—C1—C6—C50.2 (4)
Cl1—C3—C4—C5179.2 (2)C2—C1—C6—N1180.0 (2)
D—H···AD—HH···AD···AD—H···A
N1—H1A···N2i0.87 (2)2.03 (1)2.888 (2)172 (2)
N1—H1B···N2ii0.86 (1)2.08 (1)2.911 (3)162 (2)
N1—H1C···S1iii0.87 (2)2.48 (3)3.285 (2)155 (2)
Table 1

Hydrogen-bond geometry (Å, °)

D—H⋯A D—HH⋯A DA D—H⋯A
N1—H1A⋯N2i 0.87 (2)2.03 (1)2.888 (2)172 (2)
N1—H1B⋯N2ii 0.86 (1)2.08 (1)2.911 (3)162 (2)
N1—H1C⋯S1iii 0.87 (2)2.48 (3)3.285 (2)155 (2)

Symmetry codes: (i) ; (ii) ; (iii) .

  6 in total

1.  The Cambridge Structural Database: a quarter of a million crystal structures and rising.

Authors:  Frank H Allen
Journal:  Acta Crystallogr B       Date:  2002-05-29

2.  A short history of SHELX.

Authors:  George M Sheldrick
Journal:  Acta Crystallogr A       Date:  2007-12-21       Impact factor: 2.290

3.  Dicyclo-hexyl-ammonium thio-cyanate.

Authors:  M Khawar Rauf; Masahiro Ebihara; Amin Badshah
Journal:  Acta Crystallogr Sect E Struct Rep Online       Date:  2008-01-04

4.  Dicyclo-hexyl-ammonium thio-cyanate: monoclinic polymorph.

Authors:  N Selvakumaran; R Karvembu; Seik Weng Ng; Edward R T Tiekink
Journal:  Acta Crystallogr Sect E Struct Rep Online       Date:  2011-10-05

5.  2-Amino-cyclo-hexan-1-aminium thio-cyanate.

Authors:  Halima F Salem; Siti Aishah Hasbullah; Bohari M Yamin
Journal:  Acta Crystallogr Sect E Struct Rep Online       Date:  2012-05-16

6.  Structure validation in chemical crystallography.

Authors:  Anthony L Spek
Journal:  Acta Crystallogr D Biol Crystallogr       Date:  2009-01-20
  6 in total

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