Literature DB >> 21587481

1-(2,5-Dichloro-3-thien-yl)ethanone: infinite sheets mediated by O⋯Cl halogen bonds.

William T A Harrison, C S Chidan Kumar, H S Yathirajan, A N Mayekar, B Narayana.   

Abstract

In the title compound, C(6)H(4)Cl(2)OS, the acetyl group is almost coplanar with the thio-phene ring [dihedral angle = 4.01 (2)°]. In the crystal, short inter-molecular O⋯Cl contacts [2.9494 (14) and 3.1191 (14) Å] link the mol-ecules into infinite (100) sheets and aromatic π-π stacking [centroid-centroid separation = 3.5422 (10) Å] consolidates the packing.

Entities:  

Year:  2010        PMID: 21587481      PMCID: PMC2983218          DOI: 10.1107/S1600536810035154

Source DB:  PubMed          Journal:  Acta Crystallogr Sect E Struct Rep Online        ISSN: 1600-5368


Related literature

For a related structure and background references, see: Jasinski et al. (2010 ▶). For a related structure, see: Wen & Rasmussen (2007 ▶). For reference structural data, see: Allen et al. (1987 ▶). For a discussion of halogen bonding, see: Metrangalo & Resnati (2001 ▶).

Experimental

Crystal data

C6H4Cl2OS M = 195.05 Orthorhombic, a = 13.0980 (3) Å b = 7.1790 (1) Å c = 16.3290 (3) Å V = 1535.42 (5) Å3 Z = 8 Mo Kα radiation μ = 1.04 mm−1 T = 120 K 0.22 × 0.14 × 0.08 mm

Data collection

Nonius KappaCCD diffractometer Absorption correction: multi-scan (SADABS; Bruker, 2003 ▶) T min = 0.804, T max = 0.922 12928 measured reflections 1758 independent reflections 1538 reflections with I > 2σ(I) R int = 0.050

Refinement

R[F 2 > 2σ(F 2)] = 0.031 wR(F 2) = 0.078 S = 1.07 1758 reflections 92 parameters H-atom parameters constrained Δρmax = 0.34 e Å−3 Δρmin = −0.28 e Å−3 Data collection: COLLECT (Nonius, 1998 ▶); cell refinement: SCALEPACK (Otwinowski & Minor, 1997 ▶); data reduction: DENZO (Otwinowski & Minor 1997 ▶), SCALEPACK and SORTAV (Blessing, 1995 ▶); program(s) used to solve structure: SHELXS97 (Sheldrick, 2008 ▶); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008 ▶); molecular graphics: ORTEP-3 (Farrugia, 1997 ▶); software used to prepare material for publication: SHELXL97. Crystal structure: contains datablocks I, global. DOI: 10.1107/S1600536810035154/jj2050sup1.cif Structure factors: contains datablocks I. DOI: 10.1107/S1600536810035154/jj2050Isup2.hkl Additional supplementary materials: crystallographic information; 3D view; checkCIF report
C6H4Cl2OSF(000) = 784
Mr = 195.05Dx = 1.688 Mg m3
Orthorhombic, PbcaMo Kα radiation, λ = 0.71073 Å
Hall symbol: -P 2ac 2abCell parameters from 12696 reflections
a = 13.0980 (3) Åθ = 2.9–27.5°
b = 7.1790 (1) ŵ = 1.04 mm1
c = 16.3290 (3) ÅT = 120 K
V = 1535.42 (5) Å3Cut block, colourless
Z = 80.22 × 0.14 × 0.08 mm
Nonius KappaCCD diffractometer1758 independent reflections
Radiation source: fine-focus sealed tube1538 reflections with I > 2σ(I)
graphiteRint = 0.050
ω and φ scansθmax = 27.5°, θmin = 2.9°
Absorption correction: multi-scan (SADABS; Bruker, 2003)h = −17→17
Tmin = 0.804, Tmax = 0.922k = −9→9
12928 measured reflectionsl = −21→19
Refinement on F2Primary atom site location: structure-invariant direct methods
Least-squares matrix: fullSecondary atom site location: difference Fourier map
R[F2 > 2σ(F2)] = 0.031Hydrogen site location: inferred from neighbouring sites
wR(F2) = 0.078H-atom parameters constrained
S = 1.07w = 1/[σ2(Fo2) + (0.0196P)2 + 1.1699P] where P = (Fo2 + 2Fc2)/3
1758 reflections(Δ/σ)max = 0.002
92 parametersΔρmax = 0.34 e Å3
0 restraintsΔρmin = −0.28 e Å3
Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.
Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.
xyzUiso*/Ueq
C10.36993 (13)0.4974 (3)0.44792 (10)0.0181 (4)
C20.36763 (13)0.5824 (2)0.52170 (11)0.0178 (4)
H20.36180.71340.52850.021*
C30.37494 (12)0.4537 (2)0.58881 (10)0.0153 (4)
C40.38165 (13)0.2736 (2)0.56061 (11)0.0172 (4)
C50.37563 (13)0.5245 (3)0.67461 (11)0.0181 (4)
C60.37733 (14)0.3927 (3)0.74569 (11)0.0227 (4)
H6A0.37300.46340.79690.034*
H6B0.44100.32100.74480.034*
H6C0.31910.30740.74180.034*
O10.37515 (11)0.69263 (19)0.68546 (8)0.0299 (3)
S10.38011 (3)0.25777 (6)0.45563 (3)0.02062 (14)
Cl10.36483 (4)0.60020 (7)0.35316 (3)0.02524 (14)
Cl20.39243 (4)0.06821 (6)0.61358 (3)0.02400 (14)
U11U22U33U12U13U23
C10.0175 (9)0.0234 (10)0.0134 (9)−0.0004 (7)−0.0011 (6)0.0017 (7)
C20.0191 (9)0.0176 (8)0.0168 (9)0.0001 (7)0.0000 (7)0.0017 (7)
C30.0154 (8)0.0162 (8)0.0144 (9)0.0004 (6)0.0010 (6)0.0010 (7)
C40.0174 (9)0.0179 (8)0.0163 (8)−0.0007 (7)0.0008 (7)0.0006 (7)
C50.0190 (9)0.0198 (8)0.0154 (9)0.0003 (7)0.0005 (6)−0.0007 (7)
C60.0310 (11)0.0227 (10)0.0145 (10)0.0001 (7)0.0021 (7)0.0022 (7)
O10.0548 (10)0.0174 (7)0.0175 (7)0.0006 (6)−0.0007 (6)−0.0024 (6)
S10.0244 (3)0.0215 (3)0.0160 (3)−0.00193 (17)0.00004 (17)−0.00486 (17)
Cl10.0251 (3)0.0372 (3)0.0134 (2)0.00171 (19)−0.00100 (16)0.00583 (18)
Cl20.0332 (3)0.0138 (2)0.0250 (3)0.00051 (17)−0.00035 (19)0.00208 (17)
C1—C21.351 (2)C4—Cl21.7151 (18)
C1—Cl11.7156 (18)C4—S11.7181 (19)
C1—S11.7303 (19)C5—O11.220 (2)
C2—C31.437 (2)C5—C61.498 (2)
C2—H20.9500C6—H6A0.9800
C3—C41.376 (2)C6—H6B0.9800
C3—C51.490 (2)C6—H6C0.9800
C2—C1—Cl1127.54 (15)Cl2—C4—S1116.58 (10)
C2—C1—S1112.71 (13)O1—C5—C3118.28 (16)
Cl1—C1—S1119.75 (10)O1—C5—C6120.83 (16)
C1—C2—C3112.84 (16)C3—C5—C6120.88 (16)
C1—C2—H2123.6C5—C6—H6A109.5
C3—C2—H2123.6C5—C6—H6B109.5
C4—C3—C2110.71 (15)H6A—C6—H6B109.5
C4—C3—C5129.40 (16)C5—C6—H6C109.5
C2—C3—C5119.88 (15)H6A—C6—H6C109.5
C3—C4—Cl2130.13 (14)H6B—C6—H6C109.5
C3—C4—S1113.28 (13)C4—S1—C190.45 (8)
Cl1—C1—C2—C3−179.10 (13)C4—C3—C5—O1175.49 (17)
S1—C1—C2—C30.4 (2)C2—C3—C5—O1−3.7 (3)
C1—C2—C3—C4−0.5 (2)C4—C3—C5—C6−4.2 (3)
C1—C2—C3—C5178.80 (15)C2—C3—C5—C6176.57 (15)
C2—C3—C4—Cl2179.62 (14)C3—C4—S1—C1−0.14 (14)
C5—C3—C4—Cl20.4 (3)Cl2—C4—S1—C1−179.47 (11)
C2—C3—C4—S10.40 (19)C2—C1—S1—C4−0.18 (14)
C5—C3—C4—S1−178.85 (14)Cl1—C1—S1—C4179.40 (11)
  4 in total

1.  A short history of SHELX.

Authors:  George M Sheldrick
Journal:  Acta Crystallogr A       Date:  2007-12-21       Impact factor: 2.290

2.  Halogen bonding: a paradigm in supramolecular chemistry.

Authors:  P Metrangolo; G Resnati
Journal:  Chemistry       Date:  2001-06-18       Impact factor: 5.236

3.  An empirical correction for absorption anisotropy.

Authors:  R H Blessing
Journal:  Acta Crystallogr A       Date:  1995-01-01       Impact factor: 2.290

4.  (2E)-1-(2,5-Dichloro-3-thien-yl)-3-(6-meth-oxy-2-naphth-yl)prop-2-en-1-one.

Authors:  Jerry P Jasinski; Albert E Pek; C S Chidan Kumar; H S Yathirajan; A N Mayekar
Journal:  Acta Crystallogr Sect E Struct Rep Online       Date:  2010-06-18
  4 in total
  1 in total

1.  Crystal structure and Hirshfeld surface analysis of (E)-3-(2-chloro-4-fluoro-phen-yl)-1-(2,5-di-chloro-thio-phen-3-yl)prop-2-en-1-one.

Authors:  T N Sanjeeva Murthy; S Naveen; C S Chidan Kumar; M K Veeraiah; Ching Kheng Quah; B P Siddaraju; Ismail Warad
Journal:  Acta Crystallogr E Crystallogr Commun       Date:  2018-07-24
  1 in total

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