Literature DB >> 21293486

Scanning probe microscopy: Taking a closer look at conductivity.

Julie V Macpherson.   

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Year:  2011        PMID: 21293486     DOI: 10.1038/nnano.2011.8

Source DB:  PubMed          Journal:  Nat Nanotechnol        ISSN: 1748-3387            Impact factor:   39.213


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  6 in total

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Authors: 
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2.  One nanometer resolution electrical probe via atomic metal filament formation.

Authors:  Seung Sae Hong; Judy J Cha; Yi Cui
Journal:  Nano Lett       Date:  2010-12-01       Impact factor: 11.189

3.  Quantized conductance atomic switch.

Authors:  K Terabe; T Hasegawa; T Nakayama; M Aono
Journal:  Nature       Date:  2005-01-06       Impact factor: 49.962

4.  Electrical conductivity of ferritin proteins by conductive AFM.

Authors:  Degao Xu; Gerald D Watt; John N Harb; Robert C Davis
Journal:  Nano Lett       Date:  2005-04       Impact factor: 11.189

5.  Nanoionics-based resistive switching memories.

Authors:  Rainer Waser; Masakazu Aono
Journal:  Nat Mater       Date:  2007-11       Impact factor: 43.841

Review 6.  Carbon nanotube tips for atomic force microscopy.

Authors:  Neil R Wilson; Julie V Macpherson
Journal:  Nat Nanotechnol       Date:  2009-07-13       Impact factor: 39.213

  6 in total

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