Literature DB >> 21063185

Exposure assessment among US workers employed in semiconductor wafer fabrication.

Donald E Marano1, John D Boice, Heather M Munro, Bandana K Chadda, Michael E Williams, Colleen M McCarthy, Peggy F Kivel, William J Blot, Joseph K McLaughlin.   

Abstract

OBJECTIVE: To classify 100,081 semiconductor workers employed during 1983-2002, and some as early as 1968, regarding potential for chemical exposures in cleanrooms during silicon wafer fabrication.
METHODS: This study involved site visits to 10 cities with fabrication facilities, evaluation of 12,300 personal air samples for >60 chemicals, and examination of >37,000 departments and >8600 job codes to develop exposure groupings.
RESULTS: Each worker was classified into one of five exposure groups on the basis of job-department combinations: 1) fabrication process equipment operators or process equipment service technicians working in cleanrooms (n = 28,583); 2) professionals such as supervisors working in fabrication areas (n = 8642); 3) professionals and office workers in nonfabrication areas (n = 53,512); 4) back-end workers (n = 5256); or 5) other nonfabrication workers (n = 4088). More than 98% of the personal air samples were below current occupational exposure limits.
CONCLUSIONS: Although specific chemical exposures at the level of the individual could not be quantified, semiconductor workers were classified into broad exposure groups for assessment of cancer mortality in an epidemiologic study.

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Year:  2010        PMID: 21063185     DOI: 10.1097/JOM.0b013e3181f6ee1d

Source DB:  PubMed          Journal:  J Occup Environ Med        ISSN: 1076-2752            Impact factor:   2.162


  4 in total

1.  Evaluation of Hazardous Chemicals with Material Safety Data Sheet and By-products of a Photoresist Used in the Semiconductor-Manufacturing Industry.

Authors:  Miyeon Jang; Chungsik Yoon; Jihoon Park; Ohhun Kwon
Journal:  Saf Health Work       Date:  2018-08-18

2.  Comprehensive Evaluation of Hazardous Chemical Exposure Control System at a Semiconductor Manufacturing Company in South Korea.

Authors:  Sangjun Choi; Chungsik Yoon; Seungwon Kim; Won Kim; Kwonchul Ha; Jeeyeon Jeong; Jongcheul Kim; Jungah Shin; Donguk Park
Journal:  Int J Environ Res Public Health       Date:  2018-06-03       Impact factor: 3.390

Review 3.  Review for Retrospective Exposure Assessment Methods Used in Epidemiologic Cancer Risk Studies of Semiconductor Workers: Limitations and Recommendations.

Authors:  Donguk Park
Journal:  Saf Health Work       Date:  2018-06-07

4.  Occupational Characteristics of Semiconductor Workers with Cancer and Rare Diseases Registered with a Workers' Compensation Program in Korea.

Authors:  Dong-Uk Park; Sangjun Choi; Seunghee Lee; Dong-Hee Koh; Hyoung-Ryoul Kim; Kyong-Hui Lee; Jihoon Park
Journal:  Saf Health Work       Date:  2019-04-27
  4 in total

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