| Literature DB >> 18703285 |
James E Evans1, Crispin Hetherington, Angus Kirkland, Lan-Yun Chang, Henning Stahlberg, Nigel Browning.
Abstract
Spherical aberration (C(s)) correction in the transmission electron microscope has enabled sub-angstrom resolution imaging of inorganic materials. To achieve similar resolution for radiation-sensitive organic materials requires the microscope to be operated under hybrid conditions: low electron dose illumination of the specimen at liquid nitrogen temperature and low defocus values. Initial images from standard inorganic and organic test specimens have indicated that under these conditions C(s)-correction can provide a significant improvement in resolution (to less than 0.16nm) for direct imaging of organic samples.Entities:
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Year: 2008 PMID: 18703285 PMCID: PMC2758313 DOI: 10.1016/j.ultramic.2008.06.004
Source DB: PubMed Journal: Ultramicroscopy ISSN: 0304-3991 Impact factor: 2.689