Literature DB >> 16309838

On the importance of fifth-order spherical aberration for a fully corrected electron microscope.

L Y Chang1, A I Kirkland, J M Titchmarsh.   

Abstract

Next generation aberration correctors will not only eliminate the third-order spherical aberration, but also improve the information limit by correction of chromatic aberration. As a result of these improvements, higher order aberrations, which have largely been neglected in image analysis, will become important. In this paper, we concern ourselves with situations where sub-A resolution can be achieved, and where the third-order spherical aberration is corrected and the fifth-order spherical aberration is measurable. We derive formulae to explore the maximum value of the fifth-order spherical aberration for directly interpretable imaging and discuss the optimum imaging conditions and their applicable range.

Year:  2005        PMID: 16309838     DOI: 10.1016/j.ultramic.2005.09.004

Source DB:  PubMed          Journal:  Ultramicroscopy        ISSN: 0304-3991            Impact factor:   2.689


  2 in total

1.  Low-dose aberration corrected cryo-electron microscopy of organic specimens.

Authors:  James E Evans; Crispin Hetherington; Angus Kirkland; Lan-Yun Chang; Henning Stahlberg; Nigel Browning
Journal:  Ultramicroscopy       Date:  2008-07-01       Impact factor: 2.689

2.  Aberration correction for low voltage optimized transmission electron microscopy.

Authors:  Jaromír Bačovský
Journal:  MethodsX       Date:  2018-08-25
  2 in total

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