| Literature DB >> 15777595 |
John L Hutchison1, John M Titchmarsh, David J H Cockayne, Ron C Doole, Crispin J D Hetherington, Angus I Kirkland, H Sawada.
Abstract
A HREM/STEM incorporating aberration correctors in both the probe-forming and imaging lenses has been installed at Oxford University. This unique instrument is also equipped with an in-column energy-loss (Omega-type) filter, HAADF detectors above and beneath the filter, and an EDX system. Initial tests have shown it to be capable of approximately 0.1 nm resolution in both TEM and HAADF STEM imaging modes. Some examples of applications are finally presented.Year: 2004 PMID： 15777595 DOI： 10.1016/j.ultramic.2004.11.010
Source DB: PubMed Journal: Ultramicroscopy ISSN： 0304-3991 Impact factor: 2.689