Michael Siegrist, Arnim Wiek, Asgeir Helland, Hans Kastenholz. Show Affiliations »
Abstract
Mesh: See more » Expert TestimonyIndustry/statistics & numerical dataNanotechnology/statistics & numerical dataPublic OpinionRisk Assessment/statistics & numerical dataSwitzerland
Year: 2007 PMID: 18654213 DOI: 10.1038/nnano.2007.10
Source DB: PubMed Journal: Nat Nanotechnol ISSN: 1748-3387 Impact factor: 39.213