| Literature DB >> 18040371 |
M Sticker, C K Hitzenberger, R Leitgeb, A F Fercher.
Abstract
Differential phase-contrast optical coherence tomography allows one to measure the path-length differences of two transversally separated beams in the nanometer range. We calculate these path-length differences from the phase functions of the interferometric signals. Pure phase objects consisting of chromium layers containing steps of approximately 100-200-nm height were imaged. Phase differences can be measured with a precision of +/-2 degrees , corresponding to a path-difference resolution of 2-3 nm. To investigate the influence of scattering, we imaged the phase objects through scattering layers with increasing scattering coefficients. The limit of phase imaging through these layers was at approximately 8-9 mean free path lengths thick (single pass).Entities:
Year: 2001 PMID: 18040371 DOI: 10.1364/ol.26.000518
Source DB: PubMed Journal: Opt Lett ISSN: 0146-9592 Impact factor: 3.776