Literature DB >> 8688644

Evaluation of the implant-connection interface using scanning electron microscopy.

G M Vidigal1, A B Novaes, O Chevitarese, R R de Avillez, M Groisman.   

Abstract

The objective of the present study was to evaluate the implant-connection interface using scanning electron microscopy for implants commercially available in Brazil, correlating these findings with the possible effects of a badly fitted interface on the clinical failure of the implant.

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Year:  1995        PMID： 8688644

Source DB:  PubMed          Journal:  Braz Dent J        ISSN： 0103-6440


  2 in total

1.  Bacterial contamination along implant-abutment interface in external and internal-hex dental implants.

Authors:  Greison Rabelo de Oliveira; Sergio Olate; Leandro Pozzer; Lucas Cavalieri-Pereira; Jaime G Rodrigues-Chessa; José Ricardo Albergaría-Barbosa
Journal:  Int J Clin Exp Med       Date:  2014-03-15

2.  Accuracy combining different brands of implants and abutments.

Authors:  María-Fernanda Solá-Ruíz; Eduardo Selva-Otaolaurruchi; Gisela Senent-Vicente; Inés González-de-Cossio; Vicente Amigó-Borrás
Journal:  Med Oral Patol Oral Cir Bucal       Date:  2013-03-01
  2 in total

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