| Literature DB >> 8456738 |
J Zhang1, C L Wilson, M F Levesque, E J Behnke, R B Lufkin.
Abstract
The authors sought to determine whether there are any heating effects of 1.5-T MR scanning upon nickel-chromium electrodes and to confirm the safety of scanning these electrodes after intracranial surgical implantation in epilepsy patients. Since there was no significant temperature increase of the electrodes tested in their experiments, the authors conclude that nickel-chromium electrodes implanted in the brain are thermally safe for MR scanning.Entities:
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Year: 1993 PMID: 8456738 PMCID: PMC8332967
Source DB: PubMed Journal: AJNR Am J Neuroradiol ISSN: 0195-6108 Impact factor: 3.825