Literature DB >> 6345620

An x-ray spectrometric technique for measuring porcelain-metal adherence.

R D Ringle, J R Mackert, C W Fairhurst.   

Abstract

This study demonstrated a correlation between silicon x-ray counts and area fractions of adherent porcelain as determined by point-counting. This correlation has allowed a method to be devised for measuring area fractions of porcelain adherent to porcelain-fused-to-metal (PFM) fracture surfaces. The described method, after controlled destruction of the porcelain mass, uses silicon x-rays excited by the electron beam in a scanning electron microscope. Under the conditions employed in these studies, the x-ray technique has shown that this gold alloy retains more porcelain than does either of two particular nickel-chromium alloys.

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Year:  1983        PMID: 6345620     DOI: 10.1177/00220345830620081801

Source DB:  PubMed          Journal:  J Dent Res        ISSN: 0022-0345            Impact factor:   6.116


  2 in total

1.  X-ray diffraction characterization of dental gold alloy-ceramic interfaces.

Authors:  Z Cai; I Watanabe; J C Mitchell; W A Brantley; T Okabe
Journal:  J Mater Sci Mater Med       Date:  2001-03       Impact factor: 3.896

2.  X-Ray diffraction and scanning electron microscopy-energy dispersive spectroscopic analysis of ceramõmetal interface at different firing temperatures.

Authors:  Monika Saini; Suresh Chandra; Yashpal Singh; Bikramjit Basu; Arvind Tripathi
Journal:  Contemp Clin Dent       Date:  2010-07
  2 in total

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