| Literature DB >> 3873844 |
J C Weinreb, L Brateman, E E Babcock, K R Maravilla, J M Cohen, S D Horner.
Abstract
A thin, low-intensity line, which partially surrounds many structures on magnetic resonance imaging (MRI), is an artifact due to the phenomenon of chemical shift and should not be mistaken for a normal or abnormal morphologic structure. This artifact can be recognized by its characteristic appearance perpendicular to the direction of the frequency-encoding gradient at the interface of tissues with different chemical shift properties. Confinement within or extension beyond this thin, low-intensity line cannot be used as a criterion for staging neoplasms. Once recognized, the chemical shift artifact should not impede the use of MRI for clinical imaging at 0.35 T.Entities:
Mesh:
Year: 1985 PMID: 3873844 DOI: 10.2214/ajr.145.1.183
Source DB: PubMed Journal: AJR Am J Roentgenol ISSN: 0361-803X Impact factor: 3.959