Literature DB >> 36035967

MOCVD Growth and Characterization of Be-Doped GaN.

Benjamin McEwen1, Michael A Reshchikov2, Emma Rocco1, Vincent Meyers1, Kasey Hogan1, Oleksandr Andrieiev2, Mykhailo Vorobiov2, Denis O Demchenko2, Fatemeh Shahedipour-Sandvik1.   

Abstract

Beryllium has been considered a potential alternative to magnesium as a p-type dopant in GaN, but attempts to produce conductive p-GaN:Be have not been successful. Photoluminescence studies have repeatedly shown Be to have an acceptor level shallower than that of Mg, but deep Be defects and other compensating defects render most GaN:Be materials n-type or semi-insulating at best. Previous reports use molecular beam epitaxy or ion implantation to dope GaN with Be, almost exclusively. Due to the high toxicity of Be organometallics, reports of GaN:Be by metal-organic chemical vapor deposition (MOCVD) have been largely absent. Here, we report a systematic study of growth of GaN:Be by MOCVD. All doped samples show the established UV band and yellow luminescence signature of GaN:Be, and growth conditions resulting in high-quality GaN with stable Be incorporation were established. Our results show that the MOCVD growth technique allows for Be incorporation pathways that have not been possible with previous growth methodologies and is highly promising in achieving p-type conductivity in GaN:Be.
© 2022 The Authors. Published by American Chemical Society.

Entities:  

Year:  2022        PMID: 36035967      PMCID: PMC9407647          DOI: 10.1021/acsaelm.1c01276

Source DB:  PubMed          Journal:  ACS Appl Electron Mater        ISSN: 2637-6113


  6 in total

1.  Atom probe tomography and transmission electron microscopy of a Mg-doped AlGaN/GaN superlattice.

Authors:  S E Bennett; R M Ulfig; P H Clifton; M J Kappers; J S Barnard; C J Humphreys; R A Oliver
Journal:  Ultramicroscopy       Date:  2010-12-01       Impact factor: 2.689

2.  Shallow and Deep States of Beryllium Acceptor in GaN: Why Photoluminescence Experiments Do Not Reveal Small Polarons for Defects in Semiconductors.

Authors:  D O Demchenko; M Vorobiov; O Andrieiev; T H Myers; M A Reshchikov
Journal:  Phys Rev Lett       Date:  2021-01-15       Impact factor: 9.161

3.  Atom probe tomography study of Mg-doped GaN layers.

Authors:  S Khromov; D Gregorius; R Schiller; J Lösch; M Wahl; M Kopnarski; H Amano; B Monemar; L Hultman; G Pozina
Journal:  Nanotechnology       Date:  2014-06-24       Impact factor: 3.874

4.  Hillock assisted p-type enhancement in N-polar GaN:Mg films grown by MOCVD.

Authors:  Emma Rocco; Olivia Licata; Isra Mahaboob; Kasey Hogan; Sean Tozier; Vincent Meyers; Benjamin McEwen; Steven Novak; Baishakhi Mazumder; Michael Reshchikov; L Douglas Bell; F Shahedipour-Sandvik
Journal:  Sci Rep       Date:  2020-01-29       Impact factor: 4.379

5.  Boronate probe-based hydrogen peroxide detection with AlGaN/GaN HEMT sensor.

Authors:  Isra Mahaboob; Roger J Reinertsen; Benjamin McEwen; Kasey Hogan; Emma Rocco; J Andres Melendez; Nathaniel C Cady; F Shahedipour-Sandvik
Journal:  Exp Biol Med (Maywood)       Date:  2020-11-17
  6 in total

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