| Literature DB >> 35971181 |
Jiaxiang Wang1, Lingrui Wang1, Yuqiang Li2, Ruijing Fu3, Youjia Feng1, Duanhua Chang1, Yifang Yuan1, Han Gao1, Sheng Jiang4, Fei Wang1, Er-Jia Guo5, Jinguang Cheng5, Kai Wang6, Haizhong Guo1, Bo Zou6.
Abstract
Metallization has recently garnered significant interest due to its ability to greatly facilitate chemical reactions and dramatically change the properties of materials. Materials displaying metallization under low pressure are highly desired for understanding their potential properties. In this work, the effects of the pressure on the structural and electronic properties of lead-free halide double perovskite (NH4 )2 PtI6 are investigated systematically. Remarkably, an unprecedented bandgap narrowing down to the Shockley-Queisser limit is observed at a very low pressure of 0.12 GPa, showing great promise in optoelectronic applications. More interestingly, the metallization of (NH4 )2 PtI6 is initiated at 14.2 GPa, the lowest metallization pressure ever reported in halide perovskites, which is related to the continuous increase in the overlap between the valence and conduction band of I 5p orbital. Its structural evolution upon compression before the metallic transition is also tracked, from cubic Fm-3m to tetragonal P4/mnc and then to monoclinic C2/c phase, which is mainly associated with the rotation and distortions within the [PtI6 ]2- octahedra. These findings represent a significant step toward revealing the structure-property relationships of (NH4 )2 PtI6 , and also prove that high-pressure technique is an efficient tool to design and realize superior optoelectronic materials.Entities:
Keywords: Shockley-Queisser limit; high-pressure; metallization; perovskites; phase transition
Year: 2022 PMID: 35971181 PMCID: PMC9534948 DOI: 10.1002/advs.202203442
Source DB: PubMed Journal: Adv Sci (Weinh) ISSN: 2198-3844 Impact factor: 17.521
Figure 1a) In situ evolution of the absorption spectra of (NH4)2PtI6 with the pressure. b) The indirect bandgap Tauc plots under 1 atm, 0.12 GPa, and 0.3 GPa. c) The bandgap evolutions of (NH4)2PtI6 as a function of the pressure. The symbol size covers the size of the error bars.
Figure 2a) Room‐temperature resistance of (NH4)2PtI6 as a function of pressure. b,c) The pressure dependence of resistance in (NH4)2PtI6 as a function of temperature.
Figure 3a) High‐pressure evolution of ADXRD patterns of (NH4)2PtI6 as a function of the pressure. Red asterisks mark the appearance of new diffraction peaks. b–d) Rietveld refinements of (NH4)2PtI6 crystal at ambient pressure (cubic phase), 1.5 GPa (tetragonal phase), and 6.2 GPa (monoclinic), respectively.
Figure 4a,b) Representative Raman and IR spectra of (NH4)2PtI6 and c,d) the corresponding frequency shifts as a function of pressure.
Figure 5The projected band structures, DOS, and 2D electron localization function (ELF) maps on the (001) plane cutting through the Pt and I atoms of (NH4)2PtI6 at a) 0.5 GPa (P4/mnc), b) 10.0 GPa (C4/c), and c) 35.0 GPa (C4/c), respectively. The data show the bond lengths of Pt—I and I—I in unit of Å.