| Literature DB >> 35957074 |
Matlab N Mirzayev1,2,3, Alexander A Donkov3,4, Evgeni A Popov3,4,5, Ertugrul Demir6, Sakin H Jabarov1, Levan S Chkhartishvili7,8, Samuel A Adeojo9, Aleksandr S Doroshkevich3,10, Alexey A Sidorin3, Asif G Asadov3,11, Thabsile T Thabethe9, Mayeen U Khandaker12,13, Sultan Alamri14, Hamid Osman14, Alex V Trukhanov15,16, Sergei V Trukhanov15,16.
Abstract
In the presented work, B4C was irradiated with xenon swift heavy ions at the energy of 167 MeV. The irradiation of the substrate was done at room temperature to a fluence of 3.83 × 1014 ion/cm2. The samples were then analyzed with the X-ray diffraction technique to study the structural modification, as it can probe the region of penetration of xenon atoms due to the low atomic number of the two elements involved in the material under study. The nano-cluster formation under ion irradiation was observed. Positron lifetime (PLT) calculations of the secondary point defects forming nanoclusters and introduced into the B4C substrate by hydrogen and helium implantation were also carried out with the Multigrid instead of the K-spAce (MIKA) simulation package. The X-ray diffraction results confirmed that the sample was B4C and it had a rhombohedral crystal structure. The X-ray diffraction indicated an increase in the lattice parameter due to the Swift heavy ion (SHI) irradiation. In B12-CCC, the difference between τ with the saturation of H or He in the defect is nearly 20 ps. Under the same conditions with B11C-CBC, there is approximately twice the value for the same deviation.Entities:
Keywords: PLT; TCDFT; boron carbide; defect formation; defect vacancies
Year: 2022 PMID: 35957074 PMCID: PMC9370675 DOI: 10.3390/nano12152644
Source DB: PubMed Journal: Nanomaterials (Basel) ISSN: 2079-4991 Impact factor: 5.719
Figure 1X-ray diffraction. On the top, (a) is the X-ray diffraction of unirradiated (black line) and irradiated boron carbide (red line), on the bottom, (b) is the enlarged part labeled as Zone A. The XRD is able to probe through the entire depth of our B4C sample; thus, the XRD data graph shows signals from different zones in the sample: undamaged, as well as the damaged and amorphized zones.
Crystallite size of the unirradiated and irradiated B4C boron carbide sample under 167 MeV energy 132Xe26+ SHIs at 3.83 × 1014 ion/cm2.
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Figure 2Visualization of super cell of B4C and positions of point defects in vacancy cluster from 12 vacancies impurity with H or He atoms. b = 2a0 × sin(α/2), α = 65.981° a rhombohedral setting. There are presented two cases: fist polarized B11C-CBC and second B12-CCC.
The calculated values for τ in a growing nanocluster of point defects and H and He implantation.
| B11C-CBC | B12-CCC | ||||
|---|---|---|---|---|---|
| Novacancies and Impurity Atoms | Novacancies and Impurity Atoms | ||||
| bulk | 341 | 441 | bulk | 348 | 468 |
| 3H interstitials | 286 | 334 | 3H interstitials | 312 | 386 |
| 3He interstitials | 258 | 355 | 3He interstitials | 280 | 394 |
| 1VB | 354 | 464 | 1VB | 363 | 496 |
| 1VC | 354 | 464 | 1VC | 363 | 496 |
| 1VB in center of the chain | 354 | 464 | 1VC in center of the chain | 363 | 496 |
| 1VC + 11VB | 374 | 522 | 12 VB | 374 | 536 |
| 1VC + 11VB 1H nearly to C atom | 373 | 516 | 12 VB 1H nearly to C atom | 373 | 580 |
| 1VC + 11VBwith 2H in center cluster | 350 | 436 | 12 VB with 2H in center cluster | 359 | 461 |
| 1VC + 11VB 2H nearly to C | 372.2 | 515 | 12 VB 2H nearly to C | 372.7 | 532 |
| 1VC + 11VBwith 4H in center cluster | 349 | 428 | 12 VB with 4H in center cluster | 359 | 460 |
| 1VC + 11VBwith 2He in center cluster | 326 | 469 | 12 VB with 2 He in center cluster | 339 | 498 |
| 1VC + 11VBwith 4He in center cluster | 309 | 453 | 12 VB with 4 He in center cluster | 330 | 487 |
Figure 3Functional dependencies between τ and number of vacancies or H and He atoms in vacancy cluster from 12 vacancies. These ranged between the τ functions of LDA and GGA methods.