| Literature DB >> 35831327 |
Leonardo Niccolò Ialongo1,2,3, Camille de Valk4,5, Emiliano Marchese6,7, Fabian Jansen5, Hicham Zmarrou7, Tiziano Squartini6,8, Diego Garlaschelli6,4.
Abstract
Recent crises have shown that the knowledge of the structure of input-output networks, at the firm level, is crucial when studying economic resilience from the microscopic point of view of firms that try to rewire their connections under supply and demand constraints. Unfortunately, empirical inter-firm network data are protected by confidentiality, hence rarely accessible. The available methods for network reconstruction from partial information treat all pairs of nodes as potentially interacting, thereby overestimating the rewiring capabilities of the system and the implied resilience. Here, we use two big data sets of transactions in the Netherlands to represent a large portion of the Dutch inter-firm network and document its properties. We, then, introduce a generalized maximum-entropy reconstruction method that preserves the production function of each firm in the data, i.e. the input and output flows of each node for each product type. We confirm that the new method becomes increasingly more reliable in reconstructing the empirical network as a finer product resolution is considered and can, therefore, be used as a realistic generative model of inter-firm networks with fine production constraints. Moreover, the likelihood of the model directly enumerates the number of alternative network configurations that leave each firm in its current production state, thereby estimating the reduction in the rewiring capability of the system implied by the observed input-output constraints.Entities:
Mesh:
Year: 2022 PMID: 35831327 PMCID: PMC9277606 DOI: 10.1038/s41598-022-13996-3
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.996
Figure 1Visualization of the empirical adjacency matrix (a) and of the expected adjacency matrix under the dcGM (b) and under the scGM (c) with rows and columns ordered according to the sector classification of Institution 1. Each row and column in the figure represents a SBI code of 5 digits and the colour represents the empirical/expected density of the non-zero elements of the sub-adjacency matrix representing the firms in the given sectors.
Number of distinct sectors by hierarchical level used in classification codes.
| Level | SBI rule | NAICS rule | ABN | ING |
|---|---|---|---|---|
| 1 | Area | 2 digits | 19 | 23 |
| 2 | 2 digits | 3 digits | 82 | 89 |
| 3 | 3 digits | 4 digits | 253 | 303 |
| 4 | 4 digits | 5 digits | 567 | 642 |
| 5 | All digits | All (6) digits | 888 | 953 |
Figure 2Difference in log likelihood (a) and AIC (b) of the fitted models for an increasing number of sectors (layers) for the data of Institution 1. The fitness model refers to the dcGM when only one layer exists—in this case, in fact, the scGM and the dcGM coincide—and to the scGM otherwise. The results are given with respect to the best performing model. The error bars show the intervals of log likelihoods for the fitted scGM models where the sector labels have been randomized.
Figure 4Complementary cumulative distributions of the out- and in-degrees for the network of Institution 1 (a,c) and Institution 2 (b,d).
Figure 3Kolmogorov–Smirnoff distance between the degree distribution induced by the model and the empirical one for institution 1 (a) and Institution 2 (b). The error bars show the intervals of KS distances for the fitted scGM models with the randomized sector labels. Notice that, in all cases, the hypothesis that the two distributions coincide is rejected.
Figure 5Empirical vs mean node strength by sector computed over 100 samples drawn from the dcGM (a, b) and scGM (c, d) ensembles for the network of Institution 1.
Figure 6Average nearest out-neighbour out-strength vs node out-strength (a) and average nearest in-neighbour in-strength vs node in-strength (b) for Institution 1. The full lines are computed as the average over all firms (x-axis has been logarithmically binned). The shaded area represents the interval between the 5th and 95th percentile measured over the same bins.