| Literature DB >> 35807971 |
Xu Liu1,2, Xudong Zhu1, Chunqing Wang1, Yifan Cao1, Baihang Wang1, Hanwen Ou1, Yizheng Wu1, Qixun Mei1, Jialong Zhang1, Zhe Cong1, Rentao Liu1.
Abstract
Optical neural networks (ONN) have become the most promising solution to replacing electronic neural networks, which have the advantages of large bandwidth, low energy consumption, strong parallel processing ability, and super high speed. Silicon-based micro-nano integrated photonic platforms have demonstrated good compatibility with complementary metal oxide semiconductor (CMOS) processing. Therefore, without completely changing the existing silicon-based fabrication technology, optoelectronic hybrid devices or all-optical devices of better performance can be achieved on such platforms. To meet the requirements of smaller size and higher integration for silicon photonic computing, the topology of a four-channel coarse wavelength division multiplexer (CWDM) and an optical scattering unit (OSU) are inversely designed and optimized by Lumerical software. Due to the random optical power splitting ratio and incoherency, the intensities of different input signals from CWDM can be weighted and summed directly by the subsequent OSU to accomplish arbitrary multiply-accumulate (MAC) operations, therefore supplying the core foundation for scattering ONN architecture.Entities:
Keywords: coarse wavelength division multiplexer (CWDM); inverse design; metastructure; multiply–accumulate (MAC) operation; optical neural network (ONN); optical scattering unit (OSU); silicon-on-insulator (SOI)
Year: 2022 PMID: 35807971 PMCID: PMC9268426 DOI: 10.3390/nano12132136
Source DB: PubMed Journal: Nanomaterials (Basel) ISSN: 2079-4991 Impact factor: 5.719
Figure 1Three-layer CMOS-compatible SOI processing platform. This figure is adapted from [10].
Figure 2Initial guess for CWDM-DEMUX planar topology in Lumerical FDTD software.
Figure 3Inverse design of CWDM-DEMUX. (a) four-port FOM vs. iteration number; (b) sparse perturbation gradient field; (c) permittivity distribution; (d) forward direction field distribution within the device’s structure.
Figure 4Optical transmission curves for CWDM-DEMUX.
Figure 5Optical field trajectory for CWDM-DEMUX at different central wavelength of (a) 1550 nm; (b) 1570 nm; (c) 1590 nm; (d) 1610 nm.
Figure 6CWDM-DEMUX’s permittivity distribution for (a) performance-priority design in comparison with (b) manufacturability-priority design.
Figure 7GDSII pattern definition for CWDM-DEMUX metastructure layout.
Figure 8Modeling an OSU metastructure on SOI in Lumerical FDTD software.
Figure 9Inverse design of OSU. (a) four-port FOM vs. iteration number; (b) sparse perturbation gradient field; (c) permittivity distribution; (d) forward direction field distribution within the device’s structure.
Figure 10The relative electric intensity distributions at certain output port for different optical signals. (a) ; (b) ; (c) ; (d) .
Figure 11The optical field trajectory within OSU metastructure. (a) ; (b) ; (c) ; (d) .
Figure 12GDSII pattern definition for OSU metastructure layout.
Figure 13The silicon-based scattering metastructure cascading CWDM-DEMUX and OSU.