| Literature DB >> 35803971 |
Hannes Leipold1,2, Federico M Spedalieri3,4.
Abstract
We present a very general construction for quantum annealing protocols to solve Combinational Circuit Fault Diagnosis problems that restricts the evolution to the space of valid diagnoses. This is accomplished by using special local drivers that induce a transition graph on the space of feasible configurations that is regular and instance independent for each given circuit topology. Analysis of small instances shows that the energy gap has a generic form, and that the minimum gap occurs in the last third of the evolution. We used these features to construct an improved annealing schedule and benchmarked its performance through closed system simulations. We found that degeneracy can help the performance of quantum annealing, especially for instances with a higher number of faults in their minimum fault diagnosis. This contrasts with the performance of classical approaches based on brute force search that are used in industry for large scale circuits.Entities:
Year: 2022 PMID: 35803971 PMCID: PMC9270410 DOI: 10.1038/s41598-022-14804-8
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.996
Consistent assignments for a NAND gate: note that there is no restriction on the values of the inputs, their fault bits and the output (hence, we have configurations).
| ( | Consistent assignments ( |
|---|---|
| (0,0;0) | (0,0,0;0,0,1), (0,0,0;1,0,1), (0,0,0;0,1,1), (0,0,0;1,1,1) |
| (1,0;0) | (1,0,0;0,0,1), (1,0,0;1,0,1), (1,0,0;0,1,1), (1,0,0;1,1,1) |
| (0,1;0) | (0,1,0;0,0,1), (0,1,0;1,0,1), (0,1,0;0,1,1), (0,1,0;1,1,1) |
| (1,1;0) | (1,1,0;0,0,0), (1,1,0;1,0,0), (1,1,0;0,1,0), (1,1,0;1,1,0) |
| (0,0;1) | (0,0,1;0,0,0), (0,0,1;1,0,0), (0,0,1;0,1,0), (0,0,1;1,1,0) |
| (1,0;1) | (1,0,1;0,0,0), (1,0,1;1,0,0), (1,0,1;0,1,0), (1,0,1;1,1,0) |
| (0,1;1) | (0,1,1;0,0,0), (0,1,1;1,0,0), (0,1,1;0,1,0), (0,1,1;1,1,0) |
| (1,1;1) | (1,1,1;0,0,1), (1,1,1;1,0,1), (1,1,1;0,1,1), (1,1,1;1,1,1) |
However, the output fault bit is completely determined by the values of the inputs and the output.
Figure 1A schematic of the C17 circuit with a fault on output of the third NAND gate for a given input/output pair. In “Benchmarks on synthetic instances: spectral gaps and simulated annealing schedules” section, we generate new random circuits by replacing each NAND gate with a randomly selected two input logic gate.
Figure 2(1) shows the instantaneous minimum gap for 100 random instances of the generalized C17 circuit at regular discretized points of time. (2) similarly shows the instantaneous ground state gap for the same instances with a non-stoquastic version of the driver Hamiltonian.
Figure 3(1) and (2) show the success probability versus the minimum gap for 22 non-degenerate single fault instances of the C17, with 40 units and 80 units of time respectively, for the single parameter function (labeled param), the linear function (labeled linear) and a piece-wise linear function fitted over 100 evenly spaced points, such that the slope is proportional to the instantaneous inverse gap squared between evenly spaced and (labeled opt_adia).
Figure 4A schematic of the C26 circuit. For our C26 benchmarks, we replace each NAND gate with a randomly selected two input logic gate as well as randomly select inputs to the circuit. Each has 8 2-input logic gates, 6 FAN gates, 26 wires, 6 inputs, and 4 outputs.
Figure 5(1) shows a box and whisker plot of the logarithm of the minimum gap as a function of the number of faults in the MFD, while (2) shows a box and whisker plot of the location of the minimum gap versus the MFD number of faults, for randomly generated instances of C26 with non-degenerate ground states.
Figure 6Logarithm of success probability as a function of instance degeneracy and number of faults in the MFD (for different values of the total annealing time ).