| Literature DB >> 35719271 |
Kilian B Lohmann1, Silvia G Motti1, Robert D J Oliver1, Alexandra J Ramadan1, Harry C Sansom1, Qimu Yuan1, Karim A Elmestekawy1, Jay B Patel1, James M Ball1, Laura M Herz1,2, Henry J Snaith1, Michael B Johnston1.
Abstract
As perovskite-based photovoltaics near commercialization, it is imperative to develop industrial-scale defect-passivation techniques. Vapor deposition is a solvent-free fabrication technique that is widely implemented in industry and can be used to fabricate metal-halide perovskite thin films. We demonstrate markably improved growth and optoelectronic properties for vapor-deposited [CH(NH2)2]0.83Cs0.17PbI3 perovskite solar cells by partially substituting PbI2 for PbCl2 as the inorganic precursor. We find the partial substitution of PbI2 for PbCl2 enhances photoluminescence lifetimes from 5.6 ns to over 100 ns, photoluminescence quantum yields by more than an order of magnitude, and charge-carrier mobility from 46 cm2/(V s) to 56 cm2/(V s). This results in improved solar-cell power conversion efficiency, from 16.4% to 19.3% for the devices employing perovskite films deposited with 20% substitution of PbI2 for PbCl2. Our method presents a scalable, dry, and solvent-free route to reducing nonradiative recombination centers and hence improving the performance of vapor-deposited metal-halide perovskite solar cells.Entities:
Year: 2022 PMID: 35719271 PMCID: PMC9199003 DOI: 10.1021/acsenergylett.2c00865
Source DB: PubMed Journal: ACS Energy Lett Impact factor: 23.991
Figure 1PbCl2 substitution improves device performance. (a) X-ray diffraction (XRD) patterns of FA1–CsPb(I1–Cl)3 full photovoltaic devices after testing, grown with (blue line) and without (red line) PbI2 substituted for PbCl2, as denoted in the figure. The XRD patterns were acquired with a Cu–Kα 1.54 Å X-ray source, corrected for specimen displacement, and normalized. (b) Absorption coefficient of bare thin films of the aforementioned composition on z-cut quartz. The shaded region shows the unnormalized PL after photoexcitation at 470 nm. (c) External quantum efficiency (EQE) of a device with 20% PbCl2 and the corresponding integrated short-circuit current (JSC). The inset shows the absorption edge from the EQE and the Urbach tail fit (black line). (d) Time-resolved photoluminescence (PL) traces for thin films of the aforementioned bare films on quartz, after photoexcitation by a 1 MHz pulsed 470 nm laser at a fluence of 20 μJ/cm2. The black line shows a stretched exponential fit. (e) Optical-pump THz-probe (OPTP) photoconductivity transients of the aforementioned bare films on quartz after photoexcitation at 400 nm as a function of fluence (1.0, 10, 42 μJ/cm2). (f) Current–voltage (J–V) measurements of the aforementioned photovoltaic devices under AM1.5 illumination, as measured under reverse bias (solid line) and forward bias (dashed line). The inset shows the power conversion efficiency (PCE) measured at the max power point under continuous illumination over 30 s.
Figure 2Evidence for incorporation of Cl into bulk FA1–CsPb(I1–Cl)3 perovskite. (a) X-ray diffraction patterns of FA1–CsPb(I1–Cl)3 full photovoltaic devices after testing, grown with varying amounts of PbI2 substituted for PbCl2, as depicted in the legend. The y-axis shows the logarithm of the measured intensity to be able to show both the large perovskite peak and the much smaller PbI2 and CsPbCl3 peaks. The XRD patterns were acquired with a Cu–Kα 1.54 Å X-ray source. (b) Lattice parameter obtained from the XRD traces in part a for the bulk perovskite fitted to a cubic unit cell. (c) X-ray photoemission (XPS) high-resolution spectra for thin films of the aforementioned compositions deposited on ITO/PTAA, showing the Cl 2p region. (d) Normalized photoluminescence (PL) of the aforementioned bare films on quartz after photoexcitation at 470 nm. (e) Optical bandgap obtained from fits to the PL and electronic bandgap obtained from Elliot fits to the absorption spectra shown in Figure S10 for the aforementioned bare films on quartz. The error bars in parts b and e represent the 1 standard deviation range (68% confidence interval) for the respective fit parameters.
Figure 3Evidence for defect passivation of FA1–CsPb(I1–Cl)3 thin films with Cl addition. (a) Photocarrier lifetimes (blue, left) and photoluminescence quantum yield (PLQY) (red, right) of FA1–CsPb(I1–Cl)3 thin films on z-cut quartz, grown with various amounts of PbI2 substituted with PbCl2. The lifetimes were obtained from stretched exponential fits to time-resolved photoluminescence (TRPL) traces, which were obtained by photoexciting the samples with a 1 MHz pulsed 470 nm laser with a fluence of 20 μJ/cm2. The PLQY was obtained through 532 nm photoexcitation at 24 mW cm–2 intensity. (b) Charge-carrier mobilities obtained from optical-pump THz-probe spectroscopy done on the aforementioned bare films. Additional experimental details can be found in the Supporting Information. (c) Current–voltage (J–V) characteristics for reverse scans of 0.25 cm2 and 1 cm2 devices made from the aforementioned FA1–CsPb(I1–Cl)3, tested under simulated AM1.5 solar irradiance. The solar cells were made with the following p-i-n structure ITO/PTAA/perovskite/C60/BCP/Ag.