| Literature DB >> 35683147 |
Tianbiao Liu1, Kejun Bu1, Qian Zhang1,2, Peijie Zhang1, Songhao Guo1, Jiayuan Liang1, Bihan Wang1, Haiyan Zheng1, Yonggang Wang1, Wenge Yang1, Xujie Lü1.
Abstract
Understanding the relationships between the local structures and physical properties of low-dimensional ferroelectrics is of both fundamental and practical importance. Here, pressure-induced enhancement in the photocurrent of SbSI is observed by using pressure to regulate the lone-pair electrons (LPEs). The reconfiguration of LPEs under pressure leads to the inversion symmetry broken in the crystal structure and an optimum bandgap according to the Shockley-Queisser limit. The increased polarization caused by the stereochemical expression of LPEs results in a significantly enhanced photocurrent at 14 GPa. Our research enriches the foundational understanding of structure-property relationships by regulating the stereochemical role of LPEs and offers a distinctive approach to the design of ferroelectric-photovoltaic materials.Entities:
Keywords: ferroelectric semiconductor; high pressure; lone-pair electrons; photocurrent
Year: 2022 PMID: 35683147 PMCID: PMC9182005 DOI: 10.3390/ma15113845
Source DB: PubMed Journal: Materials (Basel) ISSN: 1996-1944 Impact factor: 3.748
Figure 1Pressure-induced structural evolution of SbSI. (a) Comparison of SbSI XRD at different pressures. (b) The lattice constants fitting by the Rietveld method and (c) the unit-cell volume as a function of pressure. (d) The crystal structures at 0 and 22.8 GPa.
Figure 2Optical absorption spectra of SbSI under pressure. (a) Optical absorption spectra of SbSI under pressure. (b) Pressure dependence of the bandgap energy for SbSI. Inset: optical micrographs of SbSI collected at different pressures.
Figure 3Photocurrent and resistivity of SbSI at different pressures. (a,b) Pressure-dependent photocurrent of SbSI at 0 and 5 V bias voltages. (c) Photocurrent as a function of pressure at different bias voltages. (d) The resistivity of SbSI under high pressures. The inset shows the schematic diagram for resistivity measurement.
Figure 4Electron localization function (ELF) of SbSI at different pressures. The calculated ELF plots and ELF in the (0 0 1) sections of SbSI at (a) 1.2 GPa and (b) 28.5 GPa. The isosurface value ranges from 0 to 0.93.