| Literature DB >> 35666075 |
Nan Zhou1,2, Zhimiao Zhang1, Fakun Wang3,4, Junhao Li5, Xiang Xu3, Haoran Li1, Su Ding1, Jinmei Liu1, Xiaobo Li1,2, Yong Xie1, Rusen Yang1, Ying Ma3, Tianyou Zhai3.
Abstract
Two-dimensional (2D) magnetic semiconductors are considered to have great application prospects in spintronic logic devices, memory devices, and photodetectors, due to their unique structures and outstanding physical properties in 2D confinement. Understanding the influence of magnetism on optical/optoelectronic properties of 2D magnetic semiconductors is a significant issue for constructing multifunctional electronic devices and implementing sophisticated functions. Herein, the influence of spin ordering and magnons on the optical/optoelectronic properties of 2D magnetic semiconductor α-MnSe synthesized by space-confined chemical vapor deposition (CVD) is explored systematically. The spin-ordering-induced magnetic phase transition triggers temperature-dependent photoluminescence spectra to produce a huge transition at Néel temperature (TN ≈ 160 K). The magnons- and defects-induced emissions are the primary luminescence path below TN and direct internal 4 a T1g →6 A1g transition-induced emissions are the main luminescence path above TN . Additionally, the magnons and defect structures endow 2D α-MnSe with a broadband luminescence from 550 to 880 nm, and an ultraviolet-near-infrared photoresponse from 365 to 808 nm. Moreover, the device also demonstrates improved photodetection performance at 80 K, possibly influenced by spin ordering and trap states associated with defects. These above findings indicate that 2D magnetic semiconductor α-MnSe provides an excellent platform for magneto-optical and magneto-optoelectronic research.Entities:
Keywords: broadband photodetection; magnons; spin ordering; two-dimensional magnetic semiconductors; α-MnSe
Year: 2022 PMID: 35666075 PMCID: PMC9353471 DOI: 10.1002/advs.202202177
Source DB: PubMed Journal: Adv Sci (Weinh) ISSN: 2198-3844 Impact factor: 17.521
Figure 1Preparation and characterizations of 2D α‐MnSe flakes grown by CVD. a) Preparation schematic and the structural model of nonlayered α‐MnSe. b) Optical image of prepared triangle‐shaped α‐MnSe samples. c) A typical optical image of an α‐MnSe flake, with a corresponding horizontal dimension. d) A characteristic AFM image with a cross‐sectional analysis. e) XRD patterns of the obtained α‐MnSe on mica substrate (black line), and the standard XRD patterns of α‐MnSe (blue line) and mica substrate (red line). XPS spectra of f) Mn 2P and g) Se 3d.
Figure 2TEM characterizations of as‐synthesized α‐MnSe flake. a) Low‐magnification TEM image, b) SAED patterns, and c) the corresponding HRTEM image of α‐MnSe flake in (a). d) FFT patterns simulated by Crystal Maker, in accordance with the observed diffraction patterns in (b). e) Mn and f) Se elemental imaging of α‐MnSe flake.
Figure 3Raman characterizations of 2D α‐MnSe flakes. a) A typical Raman spectrum of 17.5‐nm‐thick α‐MnSe flake on mica substrate, and the corresponding peak splitting results. b) Thickness‐dependent Raman spectra of α‐MnSe flakes on mica. c) Temperature‐dependent Raman spectra of 17.5 nm‐thick α‐MnSe flakes transferred on SiO2 substrate, and d) the corresponding peak splitting results. e) The peak intensity and peak position varying with temperature from 100 to 300 K.
Figure 4PL characterizations of 2D α‐MnSe flakes. a) Temperature‐dependent PL spectra collected from 80 to 300 K. b) Possible electron energy level diagram of α‐MnSe crystal. c) PL spectra of α‐MnSe flakes with various thicknesses at 300 K. d) PL spectra of α‐MnSe flakes with different thicknesses at 80 K.
Figure 5Optoelectronic properties of α‐MnSe‐based photodetector under room temperature and atmospheric conditions. a) Time‐resolved photoresponse of the device under dark and periodic illumination with various excitation wavelengths (365 nm @1.83 mW cm−2; 532 nm @0.42 mW cm−2; 808 nm @42 mW cm−2). b) I ph and R , c) EQE and D* of the device at various excitation wavelengths. d) I−T curves of the device under 808 nm laser with various intensities at a bias voltage of 1 V. e) Photocurrent versus varying light intensity and the acquired fitting curve. f) Temporal response of the photodetector under 808 nm illumination.
Figure 6Temperature‐dependent optoelectronic properties of α‐MnSe device under the illumination of 808 nm laser. a) Temperature‐dependent current of the device under 808 nm laser. b) I ph and R , c) EQE and D* of an α‐MnSe photodetector under 808 nm incident light in 80–300 K. d) Light‐intensity‐dependent photoresponse at a bias voltage of 1 V at 80 K. e) Photocurrent versus light intensity and the obtained fitting curve at 80 K. f) Temporal response of α‐MnSe‐based photodetector at 80 K.