| Literature DB >> 35629640 |
Masanao Inokoshi1, Kumiko Yoshihara2,3, Masayuki Kakehata4, Hidehiko Yashiro4, Noriyuki Nagaoka5, Watcharapong Tonprasong1, Kaiqi Xu1, Shunsuke Minakuchi1.
Abstract
All-ceramic restorations have become increasingly popular in dentistry. Toward ensuring that these restorations adhere to the tooth structure, this study determines the optimal femtosecond laser (FL) treatment parameters for lithium disilicate glass-ceramics and highly translucent zirconia ceramics with respect to surface morphology. For both the ceramics, the following surface conditions were investigated: (1) as-sintered; (2) Al2O3 sandblasted; (3) FL treatment (dot pattern with line distances of 14, 20, and 40 µm); (4) FL treatment (crossed-line pattern with a line distance of 20 and 40 µm). Surface roughness parameters were estimated using a 3D confocal laser microscope; microstructures were analyzed using a scanning electron microscope. Peak fluence (Fpeak) values of 4 and 8 J/cm2 and irradiation numbers (N) of 20 and 10 shots were selected to create dot patterns in highly translucent zirconia and lithium disilicate glass-ceramics, respectively. Furthermore, Fpeak = 8 J/cm2 and N = 20 shots were chosen to obtain crossed-line patterns in both ceramics. Our results show that lithium disilicate glass-ceramics and highly translucent zirconia exhibit a similar surface morphology under each of the surface treatment conditions. Therefore, FL irradiation of dot or crossed-line patterns (at a distance of 20 and 40 µm) are potential candidates for future investigations.Entities:
Keywords: femtosecond laser; irradiation; lithium disilicate; surface roughness; zirconia
Year: 2022 PMID: 35629640 PMCID: PMC9143866 DOI: 10.3390/ma15103614
Source DB: PubMed Journal: Materials (Basel) ISSN: 1996-1944 Impact factor: 3.748
Details of the femtosecond laser (FL) irradiation settings for dot pattern processing.
| Parameters 1 | IPS e.max CAD HT | KATANA UTML |
|---|---|---|
| frep, wavelength, pulse width | 10 kHz, 1030 nm, 290 fs | 10 kHz, 1030 nm, 290 fs |
| Fpeak | 8 J/cm2 | 4 J/cm2 |
| N | 10 shots | 20 shots |
| Ablated dot diameter(horizontal × vertical) | 25.5 µm × 22.3 µm | 21.3 µm × 23.6 µm |
| Ablated depth | 6.3 µm | 7.4 µm |
1 frep: pulse repetition frequency; Fpeak: peak fluence; N: the number of shots.
Details of the femtosecond laser irradiation settings for a crossed-line pattern processing.
| Parameters 1 | IPS e.max CAD HT | KATANA UTML |
|---|---|---|
| frep, wavelength, pulse width | 10 kHz, 1030 nm, 290 fs | 10 kHz, 1030 nm, 290 fs |
| Fpeak | 8 J/cm2 | 8 J/cm2 |
| Neq | 20 shots | 20 shots |
| Ablated width | 21.5 µm | 22.7 µm |
| Ablated depth | 8.8 µm | 7.1 µm |
1 Fpeak: peak fluence; Neq: equivalent irradiation number.
Figure 1Relationship between the peak fluence and treated area or depth for the dot and line pattern processing.
Figure 2Summary of the surface roughness analysis for lithium disilicate glass-ceramics.
Figure 3Summary of the surface roughness analysis of highly translucent zirconia ceramics.
Summary of the surface roughness analysis.
| Surface Condition | IPS e.max CAD HT | KATANA UTML | ||
|---|---|---|---|---|
| as-sintered | 0.1016 | 0.07066 | 0.2098 | 0.05916 |
| Al2O3 sandblasted | 0.1801 | 0.07605 | 0.3227 | 0.109 |
| dot 14 µm | 1.336 | 0.7375 | 0.8179 | 0.6564 |
| dot 20 µm | 1.303 | 0.569 | 1.692 | 1.395 |
| dot 40 µm | 1.549 | 2.13 | 1.502 | 2.636 |
| crossed-line 20 µm | 0.9738 | 0.6644 | 0.7263 | 0.5665 |
| crossed-line 40 µm | 4.108 | 2.335 | 3.037 | 2.43 |
Figure 4Microstructural analysis of the surface-treated lithium disilicate glass-ceramics. Clear LIPSS can be observed (black arrows) in the three types of dot patterns.
Figure 5Microstructural analysis of the surface-treated highly translucent zirconia ceramics. In the three types of dot patterns, clear LIPSS (black arrows) as well as micro-cracks (white arrows), can be observed.