| Literature DB >> 35629440 |
Ysmael Verde-Gómez1, Elizabeth Montiel-Macías1, Ana María Valenzuela-Muñiz1, Ivonne Alonso-Lemus2, Mario Miki-Yoshida3, Karim Zaghib4, Nicolas Brodusch5, Raynald Gauvin5.
Abstract
In the past few decades, nanostructured carbons (NCs) have been investigated for their interesting properties, which are attractive for a wide range of applications in electronic devices, energy systems, sensors, and support materials. One approach to improving the properties of NCs is to dope them with various heteroatoms. This work describes the synthesis and study of sulfur-added carbon nanohorns (S-CNH). Synthesis of S-CNH was carried out by modified chemical vapor deposition (m-CVD) using toluene and thiophene as carbon and sulfur sources, respectively. Some parameters such as the temperature of synthesis and carrier gas flow rates were modified to determine their effect on the properties of S-CNH. High-resolution scanning and transmission electron microscopy analysis showed the presence of hollow horn-type carbon nanostructures with lengths between 1 to 3 µm and, diameters that are in the range of 50 to 200 nm. Two types of carbon layers were observed, with rough outer layers and smooth inner layers. The surface textural properties are attributed to the defects induced by the sulfur intercalated into the lattice or bonded with the carbon. The XRD patterns and X-ray microanalysis studies show that iron serves as the seed for carbon nanohorn growth and iron sulfide is formed during synthesis.Entities:
Keywords: carbon nanohorns; chemical vapor deposition; iron sulfide nanoparticles; sulfurated nanostructures
Year: 2022 PMID: 35629440 PMCID: PMC9148090 DOI: 10.3390/ma15103412
Source DB: PubMed Journal: Materials (Basel) ISSN: 1996-1944 Impact factor: 3.748
Figure 1X-ray diffraction patterns of S added carbon nanohorns (S-CNHs).
Figure 2High resolution scanning electron microscopy micrographs of the SCNA9 (a), SCNA8 (b–d) samples. Using in-lens secondary electron detector with EL = E0 − Edecc = 2.0 − 1.5 = 0.5 kV (a–c) and dark-field transmitted electron detector (STEM-DF) at E0 = 30 kV (d).
Figure 3Elemental X-ray map of SCNA8 sample in STEM mode at E0 = 20 kV.
Figure 4STEM-DF images (left side) and net intensities Fe/S ratio maps (right side) of the SCNA8 (top) and SCNA9 (bottom) samples at E0 = 20 kV.
Figure 5TEM images of SCNA8 (a,b), SCNA9 (c,d), SCNB8 (e,f), and SCNB9 (g,h).
Figure 6Raman spectra of sulfur-added carbon nanostructures synthesized at different temperatures and carrier gas flow rates.