| Literature DB >> 35548233 |
Ze-Ting Zeng1,2, Feng-Xian Jiang1,2, Li-Fei Ji1,2, Hai-Yun Zheng1,2, Guo-Wei Zhou1,2, Xiao-Hong Xu1,2.
Abstract
Transition metal doped TiO2 diluted magnetic semiconductors have attracted considerable interest due to their room temperature ferromagnetism. However, most TiO2 films are highly insulating, and thus the magnetic properties can not be controlled by tuning the carrier concentration. This will limit their application in controlling magnetization via electrical gating. Here, we deposit rutile Ti1-x V x O2 (x = 0.03 and 0.05) films with the thickness between 30 and 245 nm by the pulsed laser deposition technique, and observe an obvious room temperature ferromagnetic behavior in all films. The high resolution X-ray photoelectron spectroscopy results indicate that V substituting Ti4+ ions in the TiO2 lattice, with the +3 valence state having two unpaired d electrons, is responsible for the local spin. More importantly, the systemic investigations of transport properties for Ti1-x V x O2 films reveal that the films are n-type and have metallic conductivity with a carrier density of about 1020/cm3. Further studies suggest that the oxygen vacancies play a dual role of contributing to the metallic conductivity of the Ti1-x V x O2 films, and also providing the free electrons to mediate the long-range ferromagnetic coupling between two magnetic polarons. These findings may offer promise for gate-tunable ferromagnetism in future semiconductor spintronics. This journal is © The Royal Society of Chemistry.Entities:
Year: 2018 PMID: 35548233 PMCID: PMC9085575 DOI: 10.1039/c8ra06343e
Source DB: PubMed Journal: RSC Adv ISSN: 2046-2069 Impact factor: 4.036
Fig. 1The XRD patterns of Ti1−VO2 films. The peaks marked with “S”, “A” and “R” correspond to the peaks of SrTiO3 substrates, anatase TiO2 and rutile TiO2, respectively.
Fig. 2Room temperature M − H loops of Ti0.97V0.03O2 (a) and Ti0.95V0.05O2 (b) films, respectively, with different thickness. The insets show the magnified M − H loops of the films. (c) and (d) The ZFC/FC curves of the Ti0.97V0.03O2 and Ti0.95V0.05O2 films with thickness of 50 and 60 nm, respectively.
Fig. 3The temperature dependent resistivity as a function of thickness of Ti0.97V0.03O2 (a) and Ti0.95V0.05O2 (b) films.
Fig. 4XPS spectra of Ti0.95V0.05O2 film with the thickness of 180 nm: the survey spectra (a) and high-resolved spectra of Ti 2p (b), V 2p (c) and O 1s (d), respectively.