| Literature DB >> 35457831 |
Ji Sook Yang1, Sung Hyeon Jung1, Dong Su Kim1, Ji Hoon Choi1, Hee Won Suh1, Hak Hyeon Lee1, Kun Woong Lee1, Hyung Koun Cho1,2.
Abstract
To utilize continuous ultralow intensity signals from oxide synaptic transistors as artificial synapses that mimic human visual perception, we propose strategic oxide channels that optimally utilize their advantageous functions by stacking two oxide semiconductors with different conductivities. The bottom amorphous indium-gallium-zinc oxide (a-IGZO) layer with a relatively low conductivity was designed for an extremely low initial postsynaptic current (PSCi) by achieving full depletion at a low negative gate voltage, and the stacked top amorphous indium-zinc oxide (a-IZO) layer improved the amplitude of the synaptic current and memory retention owing to the enhancement in the persistent photoconductivity characteristics. We demonstrated an excellent photonic synapse thin-film transistor (TFT) with a precise synaptic weight change even in the range of ultralow light intensity by adapting this stacking IGZO/IZO channel. The proposed device exhibited distinct ∆PSC values of 3.1 and 18.1 nA under ultralow ultraviolet light (350 nm, 50 ms) of 1.6 and 8.0 μW/cm2. In addition, while the lowest light input exhibited short-term plasticity characteristics similar to the "volatile-like" behavior of the human brain with a current recovery close to the initial value, the increase in light intensity caused long-term plasticity characteristics, thus achieving synaptic memory transition in the IGZO/IZO TFTs.Entities:
Keywords: amorphous oxide semiconductor; artificial photonic synapse; stacking structure; thin film transistor; ultralow light intensity
Year: 2022 PMID: 35457831 PMCID: PMC9031837 DOI: 10.3390/mi13040526
Source DB: PubMed Journal: Micromachines (Basel) ISSN: 2072-666X Impact factor: 3.523
Scheme 1Mechanism of synaptic weight change for visual information processing: Schematic diagrams for (a) the control of neurotransmitters induced by optical signals in the biological synapse and (b) the artificial photonic synapse oxide TFT mimicking the biological synapse.
Scheme 2Schematic diagrams showing (a) ideal output (EPSC) characteristics under different input (light) intensities and (b) ideal/real synaptic current variations under modulating light intensities. (c) Effect of channel layer properties and stacking sequence on postsynaptic current variations.
Figure 1Electrical characteristics of the single-layer oxide TFTs: Transfer curves for (a) a-IGZO TFT and (b) a-IZO TFT. Negative Vth shift of transfer curves under the NBIS test with UV light (350 nm, 8.0 μW/cm2): (c) a-IGZO TFT and (d) a-IZO TFT.
Figure 2Photonic performances of the TFTs irradiated with UV light (1 pulse) of varying light intensities: (a) a-IGZO TFT and (b) a-IZO TFT. The EPSC data for (c) a-IGZO TFT and (d) a-IZO TFT stimulated with identical UV light pulses with time intervals of 200 ms.
Figure 3Schematic band diagrams of oxide semiconductors under (a) light ON, (b) light OFF, and (c) retention conditions. (d) Variation in EPSC signals from the TFTs with the a-IZO films prepared using different Ar/O2 ratios. (e) EPSC characteristics by pulse number variation from the IGZO/IZO (Ar/O2 = 30:0 for a-IZO) synaptic transistors with a light pulse width of 100 ms. (f) STP and LTP behaviors of memory retention caused by different pulse numbers.
Figure 4EPSC characteristics of the IGZO/IZO (Ar/O2 = 30:0 for a-IZO) TFT under different modulating intensities: (a) The short-term plasticity (STP) and (b) long-term plasticity (LTP) behaviors caused from UV light of 1.6 and 8.0 μW/cm2. (c) Memory retention with EPSC decay characteristics responding to a series of increasing light intensity. (d) Comparison of the relaxation time as a function of light intensity.