| Literature DB >> 35430589 |
Patrick Laferrière1,2, Edith Yeung1,2, Isabelle Miron1,2, David B Northeast1, Sofiane Haffouz1, Jean Lapointe1, Marek Korkusinski1, Philip J Poole1, Robin L Williams1, Dan Dalacu3,4.
Abstract
We report on a platform for the production of single photon devices with a fabrication yield of 100%. The sources are based on InAsP quantum dots embedded within position-controlled bottom-up InP nanowires. Using optimized growth conditions, we produce large arrays of structures having highly uniform geometries. Collection efficiencies are as high as 83% and multiphoton emission probabilities as low as 0.6% with the distribution away from optimal values associated with the excitation of other charge complexes and re-excitation processes, respectively, inherent to the above-band excitation employed. Importantly, emission peak lineshapes have Lorentzian profiles indicating that linewidths are not limited by inhomogeneous broadening but rather pure dephasing, likely elastic carrier-phonon scattering due to a high phonon occupation. This work establishes nanowire-based devices as a viable route for the scalable fabrication of efficient single photon sources and provides a valuable resource for hybrid on-chip platforms currently being developed.Entities:
Year: 2022 PMID: 35430589 PMCID: PMC9013374 DOI: 10.1038/s41598-022-10451-1
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.996
Figure 1(a) Optical image of a 10 10 array of InP photonic nanowires. (b) Scanning electron microscopy (SEM) image viewed at 40 of the same array with (c) showing a higher magnification image of a single nanowire. Scale bars are 10 and 1 m, respectively. (d) Transmission electron microscopy image of the InAsP quantum dot embedded within a nanowire. Scale bar is 5 nm. Spatially-resolved photoluminescence (PL) from the array in (a) showing emission from (e) the InP photonic nanowire waveguide and (f) the embedded quantum dot. (g) Spectrally-resolved emission from a single device (red curve) showing InP nanowire (NW) and InAsP quantum dot (QD) emission. The NW shows band-to-band emission from wurtzite (WZ) InP as well as emission from stacking faults (SFs) and donor–acceptor (D–A) levels. Emission from the substrate (grey curve) shows two broad features at 875 nm and 900 nm associated with band-to-band and D-A recombination, respectively, in zincblende (ZB) InP.
Figure 2(a) Photoluminescence spectra of the 100 nanowires in the array under weak pumping conditions. (b) Histogram of the X emission energies extracted from the spectra in (a). (c) Power-dependence of the emission from a typical dot in a nanowire. (d) Example of a dot which shows emission from additional charge complexes.
Figure 3(a) Detected count rate of photons as a function of CW excitation power for 14 nanowire devices. (b) Radiative decay rates of the charged exciton complexes in (a). (c) Histogram of detected count rates at of photons using pulsed excitation at 80 MHz. Top axis shows source efficiency (i.e. counts at first lens) (d) As above but counting both and X photons. Top axis shows collection efficiency (i.e. counts from unfiltered photons directed up the nanowire).
Figure 4(a) Autocorrelation coincidence counts for a device showing re-excitation effects when pumped at saturation. (b) Expanded view of (a) showing the zero delay peak and dip. (c) Histogram of the coincidence counts in the zero-delay peak normalized to the counts in the side peaks for the devices pumped at .
Figure 5(a) Measured linewidth of (symbols) and a Lorentzian fit (black curve). Deconvolved linewidth is GHz (blue curve) which is life-time limit of 0.094 GHz calculated from measured lifetime (1.7 ns). (b) Deconvolved linewidths and (c) excess broadening beyond the transform limit extracted from the 14 devices.