| Literature DB >> 35331055 |
Tuomas Sormunen1, Sanna Uusitalo1, Hannu Lindström1, Kirsi Immonen2, Juha Mannila2, Janne Paaso1, Sari Järvinen1.
Abstract
The use of plastics is rapidly rising around the world causing a major challenge for recycling. Lately, a lot of emphasis has been put on recycling of packaging plastics, but, in addition, there are high volume domains with low recycling rate such as automotive, building and construction, and electric and electronic equipment. Waste plastics from these domains often contain additives that restrict their recycling due to the hazardousness and challenges they bring to chemical and mechanical recycling. As such, the first step for enabling the reuse of these fractions is the identification of these additives in the waste plastics. This study compares the ability of different optical spectroscopy technologies to detect two different plastic additives, fire retardants ammonium polyphosphate and aluminium trihydrate, inside polypropylene plastic matrix. The detection techniques near-infrared (NIR), Fourier-transform infrared (FTIR) and Raman spectroscopy as well as hyperspectral imaging (HSI) in the short-wavelength infrared (SWIR) and mid-wavelength infrared (MWIR) range were evaluated. The results indicate that Raman, NIR and SWIR HSI have the potential to detect these additives inside the plastic matrix even at relatively low concentrations. As such, utilising these methods has the possibility to facilitate sorting and recycling of as of yet unused plastic waste streams, although more research is needed in applying them in actual waste sorting facilities.Entities:
Keywords: Fourier-transform infrared; Plastic; Raman; additives; hyperspectral imaging; near-infrared; recycling; sorting
Mesh:
Substances:
Year: 2022 PMID: 35331055 PMCID: PMC9561808 DOI: 10.1177/0734242X221084053
Source DB: PubMed Journal: Waste Manag Res
Figure 1.APP and ATH centred characteristic peaks with different modalities: (a) APP at 1614 cm−1 with 785 nm Raman, (b) APP at 2130 nm with SWIR HSI, (c) APP at 5.3 µm FTIR, (d) APP at 1.58 µm with VIS-IR, (e) APP at 4.6 µm with MWIR HSI, (f) ATH at 320 cm−1 recorded with Raman, (g) ATH at 1440 nm with SWIR HSI, (h) ATH at 5.0 µm recorded with FTIR, (i) ATH at 1.44 µm with VIS-IR and (j) ATH at 2.9 µm with MWIR HSI.
Figure 2.(a) APP predictions using peak height calibration calculated from Raman, SWIR HS, FTIR and VIS-IR spectral data and (b) ATH predictions using peak height calibration calculated from Raman, SWIR HS, FTIR and VIS-IR spectral data.
The error of first-order fit of characteristic peak height as a function of additive concentration for each measurement modality in the case of APP and ATH.
| Error (%) | Raman | SWIR | FTIR | VIS-IR | MWIR |
|---|---|---|---|---|---|
| APP, RMSEC | 1.19 | 0.99 | 1.58 | 0.79 | 2.12 |
| APP, SEC | 1.22 | 1.08 | 1.71 | 0.87 | 2.32 |
| ATH, RMSEC | 0.28 | 0.24 | 1.36 | 0.34 | 1.70 |
| ATH, SEC | 0.31 | 0.26 | 1.49 | 0.37 | 1.86 |
SWIR: short-wavelength infrared; FTIR: Fourier-transform infrared; VIS-IR: visible infrared; MWIR: mid-wavelength infrared; APP: ammonium polyphosphate; RMSEC: Root Mean Square Error of Calibration; SEC: Standard Error of Calibration; ATH: aluminium trihydroxide.
Figure 3.Predicted concentration values with PLS of each measurement modality for APP (left) and ATH (right). Perfect correlation is shown with the black dashed line as a reference.
The error of PLS as a function of additive concentration for each measurement modality in the case of APP and ATH.
| Error (%) | Raman | SWIR | FTIR | VIS-IR | MWIR |
|---|---|---|---|---|---|
| APP, RMSEC | 6.71 | 7.63 | 3.92 | 6.73 | 10.80 |
| APP, SEC | 7.36 | 8.36 | 4.29 | 7.37 | 11.82 |
| ATH, RMSEC | 3.45 | 0.90 | 4.14 | 0.77 | 1.68 |
| ATH, SEC | 3.78 | 0.98 | 4.54 | 0.84 | 1.84 |
SWIR: short-wavelength infrared; FTIR: Fourier transform infrared; VIS-IR: visible infrared; MWIR: mid-wavelength infrared; APP: ammonium polyphosphate; RMSEC: Root Mean Square Error of Calibration; SEC: Standard Error of Calibration; ATH: aluminium trihydroxide.