| Literature DB >> 35325180 |
Shingo Hirashima1,2, Keisuke Ohta1,3, Yukiko Rikimaru-Nishi1,4, Akinobu Togo3, Takashi Funatsu3, Risa Tsuneyoshi1, Yuichi Shima1, Kei-Ichiro Nakamura1,5.
Abstract
Focused ion beamed (FIB) SEM has a higher spatial resolution than other volume-imaging methods owing to the use of ion beams. However, in this method, it is challenging to analyse entire biological structures buried deep in the resin block. We developed a novel volume-imaging method by combining array tomography and FIB-SEM tomography and investigated the chondrocyte ultrastructure. Our method imparts certainty in determining the analysis area such that cracks or areas with poor staining within the block are avoided. The chondrocyte surface showed fine dendritic processes that were thinner than ultrathin sections. Upon combination with immunostaining, this method holds promise for analysing mesoscopic architectures.Entities:
Keywords: FIB-SEM; array tomography; mesoscopic architecture; serial block-face scanning electron microscopy; three-dimensional analysis; volume imaging
Mesh:
Year: 2022 PMID: 35325180 PMCID: PMC9169539 DOI: 10.1093/jmicro/dfac015
Source DB: PubMed Journal: Microscopy (Oxf) ISSN: 2050-5698 Impact factor: 2.072
Fig. 1.Scheme of correlative volume-imaging combined array tomography and FIB-SEM tomography. First, a fixed specimen was trimmed and then en bloc stained. Serial sections were cut into ribbons and mounted on a silicon wafer. Second, serial sections were imaged using array tomography. After observation of the stack images and the 3D images, the ROI for FIB-SEM tomography was identified. The silicon wafer mounted on serial semithin sections was cut and placed on a customized holder. The ROI area was determined and observed using FIB-SEM.
Fig. 2.Array tomography. (a) Outline image of entire ribbons. (b) Stack image of the ROI. (c) 3D images of the ROI using volume rendering. After extensive block-face imaging, the area for FIB-SEM tomography was selected. Scale bar = 5 µm.
Fig. 3.Modified sample holder for FIB-SEM observation with cathode bias condition. (a) Groove to set sample table, (b) sample table, (c) customized holder and (d) serial sections and silicon wafer attached to the customized holder. One angle of the sample table was set at 52 to maintain the horizontal attitude of the holder and to minimize the effect of specimen tilt during ion beam milling and image acquisition cycles under the cathode bias field. The serial sections on the silico wafer were attached to the customized holder using conductive carbon double-coated tape.
Fig. 4.FIB-SEM tomography: serial cross-section. Fine dendritic processes of the chondrocytes were observed.
Fig. 5.FIB-SEM tomography: 3D reconstruction. Surface of the chondrocytes, showing many fine club-shaped or flat-shaped dendritic processes, which were not smooth and flat (white and magenta arrowheads).