| Literature DB >> 35271100 |
Keiichiro Kagawa1, Masaya Horio2, Anh Ngoc Pham2, Thoriq Ibrahim2, Shin-Ichiro Okihara3, Tatsuki Furuhashi2, Taishi Takasawa1, Keita Yasutomi1, Shoji Kawahito1, Hajime Nagahara4.
Abstract
An ultra-high-speed computational CMOS image sensor with a burst frame rate of 303 megaframes per second, which is the fastest among the solid-state image sensors, to our knowledge, is demonstrated. This image sensor is compatible with ordinary single-aperture lenses and can operate in dual modes, such as single-event filming mode or multi-exposure imaging mode, by reconfiguring the number of exposure cycles. To realize this frame rate, the charge modulator drivers were adequately designed to suppress the peak driving current taking advantage of the operational constraint of the multi-tap charge modulator. The pixel array is composed of macropixels with 2 × 2 4-tap subpixels. Because temporal compressive sensing is performed in the charge domain without any analog circuit, ultrafast frame rates, small pixel size, low noise, and low power consumption are achieved. In the experiments, single-event imaging of plasma emission in laser processing and multi-exposure transient imaging of light reflections to extend the depth range and to decompose multiple reflections for time-of-flight (TOF) depth imaging with a compression ratio of 8× were demonstrated. Time-resolved images similar to those obtained by the direct-type TOF were reproduced in a single shot, while the charge modulator for the indirect TOF was utilized.Entities:
Keywords: charge modulator; compressive imaging; computational imaging; multi-tap CMOS image sensor; ultra-high-speed imaging
Year: 2022 PMID: 35271100 PMCID: PMC8914848 DOI: 10.3390/s22051953
Source DB: PubMed Journal: Sensors (Basel) ISSN: 1424-8220 Impact factor: 3.576
Figure 1Flow of image acquisition and reproduction. * is the convolution operator.
Figure 2Image sensor architecture.
Figure 3Charge modulator drivers and pixel array.
Figure 4Timing chart of shutter controller for filming. The number of repetitions is two in this figure.
Comparison of specifications and performance.
| This Work | ISSCC’15 | IISW’19 | MDPI Sensors [ | ISSCC’12 | |
|---|---|---|---|---|---|
| Technology | 0.11 μm | 0.11 μm | 0.18 μm | 0.13 μm | 0.18 μm |
| Chip size | 7.0 mmH × 9.3 mmV | 7.0 mmH × 9.3 mmV | 4.8 mmH × 4.8 mmV | - | 15 mmH × 24 mmV |
| (Macro)pixel size | 22.4 μmH × 22.4 μmV | 11.2 μmH × 5.6 μmV | 70 μmH × 35 μmV | 12.73 μmH × 12.73 μmV | 32 μmH × 32 μmV |
| Effective (sub)pixel count | 212H × 188V | 320H × 324V | 50H × 108V | 576H × 512V | 400H × 250V |
| (Sub)pixel count per macro pixel/aperture | 2H × 2V | 5H × 3V | - | - | - |
| Tap count per (sub)pixel/aperture | 4 | 1 + drain | - | - | - |
| Maximum shutter length | 256b | 128b | - | - | - |
| Number of frames in burst operation | 12@1×, | 15@1×, | 368 (in-pixel), | 10 | 248 |
| Maximum burst frame rate | 303 Mfps | 200 Mfps | 100 Mfps | 100 Mfps | 20 Mfps |
| Image readout frame rate | 21 fps | 22 fps | N/A | - | 15 kfps |
| Power consumption | 2.8 W | 1.62 W | N/A | - | 24 W |
| Multiple exposure | Yes | Yes | No | No | No |
| Compatibility with normal optics | Yes | No | Yes | Yes | Yes |
Figure 5Chip microphotograph.
Measured characteristics.
| Conversion gain | 32.5 μV/e− |
| Read noise | 85 e−rms |
| Full-well capacity | 33,000 e− |
| Dark current (average) | 3043 e−/s@room temperature |
| Quantum efficiency | 40.6%@660 nm |
Figure 6Sensor responses measured with a short pulse semiconductor laser (λ = 445 nm, pulse width < 80 ps). (a) Non-compression with sliding time windows. (b) 8× compression with random shutters. SP: subpixel.
Figure 7Single-event filming of plasma emission. (a) Experimental setup. (b) Captured and reproduced images.
Figure 8Multi-exposure transient imaging of reflected light. The extended measurable range was doubled with compressive sensing. (a) Experimental setup. (b) Captured and reproduced images. (c) Point cloud representation of the depth map calculated from the reproduced images.
Figure 9Multi-exposure transient imaging of multiple light reflections. Two reflections on the same line of sight were decomposed. (a) Experimental setup. (b) Captured and reproduced images. (c) Point cloud representation of the depth map calculated from the reproduced images.
Figure 10(a) Skew histogram for all taps and pixels and (b) the distribution of skew for tap-1 of subpixel-1.