| Literature DB >> 35229495 |
Kun Zhang1,2, Xiaotao Jia1,3, Kaihua Cao1,2, Jinkai Wang1, Yue Zhang1,4, Kelian Lin1, Lei Chen1, Xueqiang Feng1, Zhenyi Zheng1, Zhizhong Zhang1, Youguang Zhang1, Weisheng Zhao1,2,4.
Abstract
Spintronic devices are considered as one of the most promising technologies for non-volatile memory and computing. However, two crucial drawbacks, that is, lack of intrinsic multi-level operation and low on/off ratio, greatly hinder their further application for advanced computing concepts, such as deep neural network (DNN) accelerator. In this paper, a spintronic multi-level memory unit with high on/off ratio is proposed by integrating several series-connected magnetic tunnel junctions (MTJs) with perpendicular magnetic anisotropy (PMA) and a Schottky diode in parallel. Due to the rectification effect on the PMA MTJ, an on/off ratio over 100, two orders of magnitude higher than intrinsic values, is obtained under proper proportion of alternating current and direct current. Multiple resistance states are stably achieved and can be reconfigured by spin transfer torque effect. A computing-in-memory architecture based DNN accelerator for image classification with the experimental parameters of this proposal to evidence its application potential is also evaluated. This work can satisfy the rigorous requirements of DNN for memory unit and promote the development of high-accuracy and robust artificial intelligence applications.Entities:
Keywords: deep neural network; diode; high on/off ratio; magnetic tunnel junction; multi-level memory unit
Year: 2022 PMID: 35229495 PMCID: PMC9069383 DOI: 10.1002/advs.202103357
Source DB: PubMed Journal: Adv Sci (Weinh) ISSN: 2198-3844 Impact factor: 17.521
Figure 1a) Scheme of the proposed spintronic MLMU, where the expressions of constructed components and measurement methods are also presented. b) Optical image of the fabricated PMA MTJ chain, in which varying numbers of MTJs can be connected in series. c) Schematic of three series‐connected PMA MTJs. d) TEM image of an 80‐nm‐diameter PMA MTJ pillar. e) R–H curve of three series‐connected PMA MTJs under DC = 0.5 µA.
Figure 2a) Measured and calculated I–V curve of the combined device. Inset shows the schematic of combined device. b) Measured and calculated rectification voltage versus AC amplitude. Inset shows the deduced on/off ratio. c) Dependence of rectification voltage on magnetic field under AC = 10 µA and various DC offsets. d) Measured and calculated rectification voltage as a function of DC offset with different AC amplitudes. e) Measured and calculated on/off ratio as a function of DC offset and AC amplitude. In (a), (b), (d), and (e), the scattering points are experimental data and the lines are theoretical simulation results. f) Distribution of the on/off ratio under different AC and DC components. The colors represent the absolute values of the on/off ratio.
Figure 3a) Measured and calculated I–V curves of the MLMU. The inset shows schematic of the four‐state MLMU. b) Measured and calculated rectification voltage of each state versus AC amplitude. c) Measured and calculated rectification voltage of each state modulated by DC offsets under AC = 3 µA. d) On/off ratio of the MLMU with AC and DC modulation. Inset: positive branch under logarithmic ordinate. In these figures, the scattering points are experimental data and the lines are theoretical simulation results.
Figure 4Operating process of the 4 MLMU including data writing based on STT effect and data reading with high on/off ratio. Inset: STT‐induced switching of each MTJ. Bottom figure frame: the independently applied pulse voltage on different MTJs. Middle figure frame: the measured rectification voltage of spintronic MLMU under different states with AC = 3 µA and DC = 0.29 µA. Top figure frame: the corresponding resistance states of the three series‐connected MTJs under DC = 0.5 µA.
Figure 5a) Schematic of the VGG‐8 model used for classification of images from CIFAR‐10 dataset. b) Classification accuracy versus on/off ratio for two and four states per unit. c) Impact of device/state variations on classification accuracy for different on/off ratios.