Ernestas Kasparavicius1, Marius Franckevičius2, Vida Malinauskiene1, Kristijonas Genevičius3, Vytautas Getautis1, Tadas Malinauskas1. 1. Department of Organic Chemistry, Kaunas University of Technology, Radvilenu pl. 19, Kaunas LT-50254, Lithuania. 2. Department of Molecular Compound Physics, Centre for Physical Sciences and Technology, Saulėtekio Avenue 3, Vilnius LT-10257, Lithuania. 3. Institute of Chemical Physics, Faculty of Physics, Vilnius University, Sauletekio al. 3, Vilnius 10257, Lithuania.
Abstract
The power conversion efficiency of perovskite solar cells (PSCs) has risen steadily in recent years; however, one important aspect of the puzzle remains to be solved-the long-term stability of the devices. We believe that understanding the underlying reasons for the observed instability and finding means to circumvent it is crucial for the future of this technology. Not only the perovskite itself but also other device components are susceptible to thermal degradation, including the materials comprising the hole-transporting layer. In particular, the performance-enhancing oxidized hole-transporting materials have attracted our attention as a potential weak component in the system. Therefore, we performed a series of experiments with oxidized spiro-OMeTAD to determine the stability of the material interfaced with five most popular perovskite compositions under thermal stress. It was found that oxidized spiro-OMeTAD is readily reduced to the neutral molecule upon interaction with all five perovskite compositions. Diffusion of iodide ions from the perovskite layer is the main cause for the reduction reaction which is greatly enhanced at elevated temperatures. The observed sensitivity of the oxidized spiro-OMeTAD to ion diffusion, especially at elevated temperatures, causes a decrease in the conductivity observed in the doped films of spiro-OMeTAD, and it also contributes significantly to a drop in the performance of PSCs operated under prolonged thermal stress.
The power conversion efficiency of perovskite solar cells (PSCs) has risen steadily in recent years; however, one important aspect of the puzzle remains to be solved-the long-term stability of the devices. We believe that understanding the underlying reasons for the observed instability and finding means to circumvent it is crucial for the future of this technology. Not only the perovskite itself but also other device components are susceptible to thermal degradation, including the materials comprising the hole-transporting layer. In particular, the performance-enhancing oxidized hole-transporting materials have attracted our attention as a potential weak component in the system. Therefore, we performed a series of experiments with oxidized spiro-OMeTAD to determine the stability of the material interfaced with five most popular perovskite compositions under thermal stress. It was found that oxidized spiro-OMeTAD is readily reduced to the neutral molecule upon interaction with all five perovskite compositions. Diffusion of iodide ions from the perovskite layer is the main cause for the reduction reaction which is greatly enhanced at elevated temperatures. The observed sensitivity of the oxidized spiro-OMeTAD to ion diffusion, especially at elevated temperatures, causes a decrease in the conductivity observed in the doped films of spiro-OMeTAD, and it also contributes significantly to a drop in the performance of PSCs operated under prolonged thermal stress.
Perovskite solar cells
(PSCs) have shown an impressive increase
in device efficiency from 3.8 to 25.5% in recent years.[1] The observed improvement is due to a combination
of advantageous properties, such as long diffusion lengths for electrons
and holes, high absorption coefficient, low material cost,[2−4] and relative simplicity in the device fabrication.[5] Although the efficiency of PSCs has steadily increased
over the last decade, there is a significant interest in commercializing
the technology. Unfortunately, the long-term stability of the devices
is insufficient and it should be solved before market entry. A number
of factors have been found to influence the extent of degradation
and its rate, including moisture and oxygen ingress,[6] UV light,[6] electrical bias,[7−10] temperature,[11,12] and their variation.[13] Obviously, understanding the underlying reasons
for the observed instability and finding means to circumvent them
is crucial for the future development of the PSC technology.Temperature-induced degradation of PSCs is a particularly interesting
and important topic, as temperatures as high as 40–45 °C
can routinely occur under ambient conditions, while peak temperatures
can be even higher, especially in hot desert environments, which are
particularly attractive for photovoltaic energy generation due to
the large number of sunshine hours and large unused area. Typically,
photovoltaic devices are operated in direct sunlight, and the temperature
of the panel can be up to 45 °C higher than the ambient temperature,
exceeding 90 °C.[14]Methylammonium
lead iodide (MAPI) decomposes rapidly at temperatures
around 135–150 °C, and even at 65–85 °C, slow
decomposition is observed.[15,16] Moreover, perovskites
react with almost all metals, especially at moderate temperatures
and illumination, as heat volatilizes the halide species and light
increases the halogen mobility.[17−19] Fortunately, the problems of
thermal stability of perovskites could be alleviated and resistance
to decomposition at operating temperatures improved by substituting
methylammonium with formamidinium, Cs, or Rb.[20−22]Unfortunately,
not only the perovskite itself but also other device
components are susceptible to thermal degradation, including the materials
comprising the hole-transporting layer. Most commonly, hole-transporting
materials (HTMs) are used with performance enhancing additives and
dopants.[23] At elevated temperatures, additives
such as 4-tert-butylpyridine can evaporate, leading
to the formation of voids[24,25] or induce undesirable
crystallization of the HTM in the film.[26] Oxidized HTMs can react with 4-tert-butylpyridine
to form pyridinated products.[27,28] Moreover, lithium bis(trifluoromethanesulfonyl)imide
(LiTFSI), another commonly used dopant, is quite hygroscopic, which
further exacerbates the problem of moisture sensitivity of the perovskite.[29]Diffusion of the mobile ions into the
charge-transporting layers
(CTLs) is another potential problem that is magnified at elevated
temperatures.[30] It has been shown that
the migration of these ions can negatively affect the long-term stability
of the PSC devices.[31−35] It has been also reported that halides such as iodine and bromine
are among the main culprits in elemental diffusion. The migration
of these mobile ions beyond the perovskite/CTL interfaces can lead
to an undesirable reaction between mobile ions and the CTL materials
or metal electrode.[34,36,37]Currently, 2,2′,7,7′-tetrakis(N,N-di-p-methoxyphenylamine)-9,9′-spirobifluorene
(spiro-OMeTAD) is one of the most popular HTMs used in PSC research.[23] To achieve the high efficiency devices, the
conductivity of spiro-OMeTAD must be improved which is usually achieved
by oxidizing a portion of the spiro-OMeTAD molecules using various
dopants. Recently, it was observed that oxidized spiro-OMeTAD readily
reacts with I- ions, migrating from MAPI under device operation, leading
to a reduction of oxidized spiro-OMeTAD and a decrease in the conductivity
of the transport layer.[32] These diffusion
and spiro-OMeTAD dedoping processes were observed to be thermally
accelerated in MAPbI3 (MAPI) and FAPbI3 at elevated
temperatures.[32,36,38]It is evident that thermally accelerated ion diffusion processes
observed in MAPI and FAPbI3 perovskites can lead to a significant
long-term decrease in device performance due to the reduction of the
oxidized spiro-OMeTAD. However, in recent years, a number of improved
and more degradation-resistant perovskite compositions have been developed,
particularly those containing cesium. Ion migration into the hole-transporting
spiro-OMeTAD layer under thermal stress has not been studied in these
new perovskites. Therefore, it is important to understand if the same
issues exist in Cs-based perovskite systems. In the current publication,
we investigate thermal stability of the oxidized spiro-OMeTAD in contact
with various most popular perovskite compositions. Due to the complex
nature of PSC devices and the multitude of possible processes occurring
simultaneously, we have chosen to focus mostly on a specific problem
of spiro-OMeTAD dedoping during the interaction between perovskite
and oxidized spiro-OMeTAD in thin films at elevated temperatures,
rather than attempting to evaluate the entire system at once.
Results
and Discussion
As mentioned in the Introduction, the interaction
of oxidized spiro-OMeTAD with iodide ions migrating from MAPI at elevated
temperatures leads to dedoping of the HTM, which is a major problem
for the long-term stability of MAPI based PSCs. However, in recent
years, a number of new perovskite compositions have been developed
that exhibit improved stability compared to the original MAPI.[21,39] Therefore, we decided to perform a series of experiments under different
conditions to investigate the long-term stability of the oxidized
HTM when interfaced with these new perovskites. Usually, oxidized
HTM constitutes only a small part of the hole-transporting layer,
the rest being regular neutral molecules. Therefore, it is quite difficult
to monitor the degradation dynamics of oxidized HTM in the film in
real time because their concentration is low and oxidized molecules
are difficult to identify by standard analytical methods. For example,
nuclear magnetic resonance (NMR) is not suitable at all due to the
paramagnetic nature of the oxidized species, while identifying the
oxidized species using mass spectrometry (MS) is difficult, as oxidized
spiro-OMeTAD (spiro[TFSI]2) will only show the parent cation
mass in MS and will start to revert back to spiro-OMeTAD in the HPLC
column.[28,40,41] Fortunately,
cation radicals intensely absorb light in the visible region of the
spectrum, and UV–vis spectroscopy could be effectively used
to monitor changes in encapsulated systems without breaking encapsulation
or degrading the samples. In our recent study, we investigated the
stability of different oxidized HTMs and their behavior was very similar.[28] Therefore, for this study, we focused on the
most popular and intensively used spiro-OMeTAD as HTM. The oxidized
spiro-OMeTAD (Figure ), used in this study was synthesized by chemical oxidation with
silver bis(trifluoromethanesulfonyl)imide.[40,41]
Figure 1
Structure
of the investigated HTM spiro-OMeTAD and its oxidized
analogue spiro[TFSI]2.
Structure
of the investigated HTM spiro-OMeTAD and its oxidized
analogue spiro[TFSI]2.We first investigate the interaction of spiro[TFSI]2 with
organic counterparts of perovskite such as methylammonium iodide
(MAI), formamidinium iodide (FAI), and methylammonium bromide (MABr)
by preparing solutions in acetonitrile. The initial experiments showed
that the addition of FAI to the dissolved spiro[TFSI]2 caused
an immediate color change (Figure S6a)
as well as disappearance of the absorption maxima associated with
oxidized HTM at about 510 nm and an enhancement of the absorption
maxima associated with neutral spiro-OMeTAD at 380 nm (Figure S6b). A similar result was observed for
MAI (Figure S7).Processes that take
place in solution do not necessarily take place
on the surface of the solid film because the molecules are much more
mobile and the interaction is easier and faster in the solution. Therefore,
we additionally studied the interaction between the spiro[TFSI]2 film and solutions of FAI or MAI. To exclude the possibility
of dissolution of the film by the solvent, we specifically chose a
mixture of ethanol and H2O (1:1) to dissolve the organic
salts but not the film of spiro[TFSI]2 (Figure S9). In both cases, spinning solution of the organic
salts (MAI or FAI) on top of the spiro[TFSI]2 film resulted
in immediate discoloration of the sample and disappearance of the
characteristic absorbance maximum (Figures S10 and S11), indicating an interaction between spiro[TFSI]2 in the film and perovskite precursors. Similar experiments
with solvent without MAI or FAI did not produce such results (Figure S9).Interestingly, the substitution
of iodine by bromine in MABr resulted
in a significantly reduced reaction rate (Figures S8 and S12). The process, which took only minutes in the case
of iodide-containing organic salts, lasted days to complete when MABr
was used. Although a significant decrease in light absorption intensity
at 510 nm is observed after the sample is kept at 100 °C for
24 h (under inert conditions), this indicates that the reaction is
indeed taking place, albeit at a much slower rate, and that it is
accelerated by increasing the temperature.To study the process
in more detail and establish the final products,
reactions with larger quantities of spiro[TFSI]2, MAI,
and FAI were performed. After the reaction, one main product was isolated
in very high yields. NMR and MS analyses (Figures S1–S3) identified that the reduction of spiro[TFSI]2 back to spiro-OMeTAD takes place during the interaction between
spiro[TFSI]2 and MAI or FAI. A simple iodine test (Figure
S5) and iodometric titration (see the Supporting Information for more details) indicated the formation of iodine
during the process (Figure ). We also performed MS analysis of the products obtained
from the reaction between spiro[TFSI]2 and MAI, FAI, or
MABr in solution. The interaction of spiro[TFSI]2 with
MAI or FAI resulted only in the formation of the reduction product,
namely, spiro-OMeTAD (Figures S33 and S34). Whereas during the slower reaction of spiro[TFSI]2 with
MABr, both spiro[TFSI]2 and spiro-OMeTAD were detected
(Figures S31 and S32). Overall, experiments
with the organic halide precursors demonstrate what sort of processes
occur and do they take place in the solid state where molecules are
a lot less mobile.
Figure 2
Proposed reaction of the oxidized spiro-OMeTAD with MAI
and FAI.
Proposed reaction of the oxidized spiro-OMeTAD with MAI
and FAI.It is interesting that oxidized
HTM reacts so readily with perovskite
precursors; however, the more important question is whether the same
process occurs in the solid state between the complete perovskite
and spiro[TFSI]2 films, as this is more relevant to the
actual PSC devices. For this reason, we have performed experiments
in the solid state with oxidized spiro-OMeTAD and five different popular
perovskite compositions: Cs5(MA0.17FA0.83)95Pb(I0.83Br0.17)3 (CsMAFA),
MA0.17FA0.83Pb(I0.83Br0.17)3 (MAFA), FA0.83Cs0.17Pb(I0.83Br0.17)3 (CsFA), MAPI, and MAPbBr3 (MAPB).Due to the complex nature of PSC devices, multiple
processes take
place simultaneously during device operation; therefore, we first
chose to focus specifically on the stability of oxidized spiro-OMeTAD
in contact with the perovskite film, rather than trying to evaluate
the undergoing processes in the complete device. If observed reactions
do take place in the described setup, it could be a very strong indicator
that the same processes will happen in the PSCs, although during a
longer time frame, as concentration of the oxidized spiro-OMeTAD in
the actual devices is lower.Investigated spiro[TFSI]2 has been deposited as a thin
film on top of the perovskite. The glass substrate with two deposited
layers was encapsulated under an inert atmosphere with a second glass
substrate and stored under different conditions for almost 2 months
(see the Supporting Information for more
details). The UV–vis spectra of the studied samples were recorded
periodically during the experiments (Figures S13–S27), and the results were compared with two different reference samples:
the pure perovskite film and spiro-OMeTAD film on top of the perovskite.
The absorption of the neutral and oxidized spiro-OMeTAD compounds
was measured at the corresponding absorption maxima of 380 and 510
nm, respectively. The perovskite absorption was followed at 590 nm
so that it would not overlap with the absorption maxima of spiro-OMeTAD
and spiro[TFSI]2; the only exception is MAPbBr3, which was followed at 510 nm due to its narrower absorption interval.
Thinner perovskite films were produced (see the Supporting Information for more details) so that light absorbance
by the perovskite would not interfere too significantly with that
of spiro-OMeTAD and spiro[TFSI]2.Experiments with
spiro[TFSI]2 on MAPI at 100 °C
in the dark showed that there is a rapid decrease in absorption intensity
at 510 nm and an increase at 380 nm (Figures a and 4a), indicating
the reduction of the oxidized species and the formation of the neutral
spiro-OMeTAD. The whole process lasted less than 1 day, and only minor
changes in the UV–vis spectrum were observed afterward. Similar
processes, although not as intense and fast, can be observed in samples
kept under illumination at room temperature (RT) (Figure a) and even in the dark (Figure S28a)
Figure 3
Change in light absorption of the encapsulated
spiro[TFSI]2 films on various perovskites, MAPI (a), MAFA
(b), CsMAFA
(c), CsFA (d), and MAPB (e), at 100 °C in the dark.
Figure 4
Light absorption intensity dynamics at 100 °C temperature
in the dark of the spiro[TFSI]2 or spiro-OMeTAD films on
different perovskites: MAPI (a), MAFA (b), CsMAFA (c), CsFA (d), and
MAPB (e).
Figure 5
Light absorption intensity dynamics of spiro[TFSI]2 and
spiro-OMeTAD layers on different perovskites, MAPI (a), MAFA (b),
CsMAFA (c), CsFA (d), and MAPB (e), obtained at room temperature under
daylight conditions.
Change in light absorption of the encapsulated
spiro[TFSI]2 films on various perovskites, MAPI (a), MAFA
(b), CsMAFA
(c), CsFA (d), and MAPB (e), at 100 °C in the dark.Light absorption intensity dynamics at 100 °C temperature
in the dark of the spiro[TFSI]2 or spiro-OMeTAD films on
different perovskites: MAPI (a), MAFA (b), CsMAFA (c), CsFA (d), and
MAPB (e).Light absorption intensity dynamics of spiro[TFSI]2 and
spiro-OMeTAD layers on different perovskites, MAPI (a), MAFA (b),
CsMAFA (c), CsFA (d), and MAPB (e), obtained at room temperature under
daylight conditions.The migration of iodide
ions in the solid state at elevated temperature
is sufficiently intense to reduce spiro[TFSI]2 to the neutral
molecule in a few hours. Even at RT, the process can be observed for
extended periods of time. Similar to reports in the literature,[15,16] a decrease in perovskite absorption intensity is also observed at
elevated temperatures (Figures a and S13c), indicating thermal
stability related issues with MAPbI3.A similar picture
can be observed using FA- and MA-containing perovskite
MAFA (Figures b and 4b), where the absorption intensity of spiro[TFSI]2 decreases more rapidly under thermal stress rather than under
direct sunlight at RT (Figure b). Similarly to MAPbI3, MA- and FA-containing
perovskite also demonstrates some loss of absorption intensity at
elevated temperatures, again indicating sensitivity of the material
to elevated temperatures over extended periods of time (Figures b and S16c).The introduction of the Cs cation into the CsMAFA
and CsFA perovskite
compositions results in improved stability of the materials under
prolonged thermal stress (Figure c,d). However, iodide ions still diffuse into the adjacent
spiro[TFSI]2 layer, promoting relatively rapid reduction
of the material at 100 °C (Figures c,d and 4c,d). Similarly
as with other types of perovskites, ion migration undergoing at RT
deteriorates spiro[TFSI]2, which is confirmed by the decrease
in the intensity of the absorption peak at 510 nm (Figures c,d and S29).Interestingly, the perovskite films with spiro-OMeTAD
show very
little change during prolonged tests (Figures and 5), suggesting
that the neutral molecule is sufficiently stable under the conditions
studied.During these experiments, we did not observe any significant
crystallization
of the oxidized spiro-OMeTAD, as it takes about a week for it to become
noticeable,[28] and in the current investigation,
we saw that oxidized spiro-OMeTAD is reduced back to spiro-OMeTAD
much faster (in 1–2 days). Additionally we did not use 4-tert-butylpyridine (tBP) which accelerates the crystallization
of both spiro[TFSI]2 and spiro-OMeTAD.[26]The substitution of the iodide with bromide ion in
the MAPB perovskite
results in improved resistance of the perovskite material to thermal
stress (Figure e).
The lower reactivity of the bromide ensures that the reduction of
spiro[TFSI]2 at 100 °C is much slower and takes days
rather than hours (Figures e and 4e), while only a slight change
in absorption intensity is observed at RT (Figure e).To confirm that the same reaction
occurs in the solid films as
in the solution, HPLC-MS analysis of the samples was performed after
stability experiments. The identification of the oxidized material
is problematic because spiro[TFSI]2 starts to change back
to a neutral molecule in the HPLC column and only the mass of the
parent molecule can be observed in MS.[40,41] Fortunately,
the reduction process in the column is slow enough to detect two elution
peaks at different retention times one for spiro[TFSI]2 (retention time 6.9 min) and another for spiro-OMeTAD (retention
time 7.6 min) (Figures S40 and S41), both
giving 1225 mass spiro-OMeTAD molecular cation [M + H]+.Only neutral spiro-OMeTAD was detected in all of the samples
with
spiro[TFSI]2 on different perovskite compositions stored
at 100 °C for 56 days (Figures S35–S39). The results of HPLC-MS analysis correlate well with the data obtained
from UV–vis spectroscopy.In addition to UV–vis
measurements, the changes in conductivity
were also investigated. Oxidized and pristine spiro-OMeTAD were deposited
on top of the different perovskite compositions and conductivity was
measured at an elevated temperature (100 °C) in the dark (Figure ). In addition, samples
containing only pristine or oxidized HTM on glass substrate were also
measured.
Figure 6
Change in conductivity of the spiro[TFSI]2 or spiro-OMeTAD
encapsulated films on different perovskites, MAPI (a), MAFA (b), CsMAFA
(c), CsFA (d), and MAPB (e), at 100 °C in the dark.
Change in conductivity of the spiro[TFSI]2 or spiro-OMeTAD
encapsulated films on different perovskites, MAPI (a), MAFA (b), CsMAFA
(c), CsFA (d), and MAPB (e), at 100 °C in the dark.The observed conductivity of the samples, containing the
perovskite
compositions MAFA, CsFA, and MAPI and a layer of spiro[TFSI]2, degrade very rapidly. During the first hour, it decreases by several
orders of magnitude and becomes very similar to that registered for
spiro-OMeTAD (Figure a,c,d). Interestingly, spiro[TFSI]2 with the perovskite
composition CsMAFA performs slightly better (Figure b), and its decay is somewhat slower, although
the final result is very similar to those previously discussed. As
expected from the UV–vis data, spiro[TFSI]2 with
MAPB shows the slowest decrease in conductivity (Figure e). It is worth noting that
the conductivity of the pristine spiro[TFSI]2 also diminishes
with time, although not as rapidly as in the samples with perovskite
absorber. Overall, due to increased temperature,[42] somewhat lower conductivity is measured at 100 °C,
compared with the results recorded at room temperature (Table S1).We have additionally performed
stability tests on the complete
solar cell devices based on the triple cation CsMAFA and the classical
MAPI compositions. The PSCs of each composition were constructed using
three different HTM variations: undoped spiro-OMeTAD, spiro[TFSI]2, or spiro-OMeTAD doped with typical dopants used in PCS research,
tBP, LiTFSI, and tris[2-(1H-pyrazol-1-yl)-4-tert-butylpyridine]cobalt(III) (FK-209). Two different environmental
conditions were used to study the long-term stability of the devices:
(i) the devices were stored in air under light at 90 °C and (ii)
the devices were stored in nitrogen at 90 °C without light. We
investigated the stability of the solar cells by monitoring the power
conversion efficiency over time. Figure S45 shows the photovoltaic stability data of the different PSCs obtained
for each condition. The current–voltage characteristics of
the devices are shown in Figures S43 and S44, while the photovoltaic parameters are summarized in Tables S2–S13.The solar cells kept
under ambient conditions were particularly
unstable (Figure S45a,b). Both the MAPI
and CsMAFA devices experienced significant efficiency degradation
over time and after 50 h of continuous aging, their efficiency has
halved. To see the influence of the temperature alone, we also kept
the devices under the elevated temperature while suppressing other
environmental factors. It is evident that the devices that were exclusively
exposed to elevated temperatures (Figure S45c,d) show improved stability compared to the ones kept under ambient
conditions, which is mainly caused by the reduced photooxidation-induced
degradation of the perovskite. If we focus on the HTM present in the
devices, as shown in Figure S45c,d, the
degradation of both MAPI and CsMAFA PSCs containing doped spiro-OMeTAD
is faster than those with undoped spiro-OMeTAD, especially at longer
times. The poor stability is most likely related to the presence of
oxidized spiro-OMeTAD as well as dopants (such as LiTFSI and tBP),
which can be released over time, degrading the interfaces and reducing
device performance. The stability of oxidized spiro-OMeTAD is worse
than the undoped analogue, as it is reduced back to the neutral molecules
as discussed above. However, its stability tends to be better than
doped spiro-OMeTAD, suggesting that the reduction of not only the
oxidized species but also dopants has significant impact on device
stability at elevated temperatures.As the presence of oxidized
HTM molecules in the CTL significantly
improves conductivity,[40,43] the observed sensitivity of oxidized
spiro-OMeTAD to ion diffusion from the perovskite, especially under
thermal stress, is among the main causes of conductivity decrease
in the doped films of spiro-OMeTAD.[38] Additionally,
it is one of the important reasons for decline in performance of PSCs
operated under prolonged thermal stress.In the broader context
of research performed recently addressing
stability issues, at the first glance, results reported in this publication
would seem to contradict them. However, if we look at the device stability
curves presented in the research articles describing PSCs containing
doped spiro-OMeTAD, for example, Christians et al.,[44] Seo et al.,[45] and Kong et al.,[46] there is a slow but consistent decrease in device
performance. This drop in performance can be attributed to more than
one factor; however, it does not eliminate the prospect that processes
described in this publication are also playing a role. We also have
to consider the fact that, aging conditions used in this publication
were harsher, which in turn led to faster degradation of the devices.
Furthermore, concentration of oxidized HTM is significantly lower
(10% or less[40]) in the devices constructed
using doped spiro-OMeTAD, so processes described in this publication
would take substantially longer to manifest in full.A possible
solution could be the use of charge-transporting materials
that do not rely on doping and oxidized molecules to function effectively
in PSC.[47] Alternatively, suppression of
ion migration via low-dimensional diffusion barriers,[48] blocking layer,[6,49] or defect passivation[50,51] could be another option. Finally, the use of charge-transporting
materials capable of forming a self-assembled monolayer could simultaneously
solve both doping and HTM film quality issues.[52,53]
Conclusions
In conclusion, a series of experiments were
performed with oxidized
spiro-OMeTAD to determine the stability of the material in contact
with various most popular perovskite compositions. Particular attention
was given to the long-term stability of the material under thermal
stress. It was found that oxidized spiro-OMeTAD is readily reduced
to the neutral molecule upon interaction with the perovskite precursors
MAI and FAI in the solution as well as with all five perovskite compositions
in the solid state. We have found that the presence of iodide ions,
either in solution or by ion migration from the perovskite layer,
is the main cause of the dedoping process. During the reaction, oxidized
spiro-OMeTAD is reduced back to the neutral molecule and iodine is
formed. In the thin films, ion diffusion and consequently reduction
of oxidized spiro-OMeTAD is greatly enhanced at elevated temperatures,
leading to a complete disappearance of spiro[TFSI]2 within
a few days. The observed processes take place for all perovskite compositions,
although it is worth mentioning that spiro[TFSI]2 degrades
significantly slower in contact with MAPB due to the lower reaction
rate with the bromide ion. Because the presence of oxidized HTM molecules
in the CTL significantly improves the conductivity, the observed sensitivity
of spiro[TFSI]2 to ion diffusion from the perovskite, especially
under thermal stress, could be one of the reasons for the decrease
in conductivity observed in the doped films of spiro-OMeTAD and the
subsequent decrease in the performance of PSCs operated at elevated
temperatures. Possible solutions to this problem could be the use
of materials that do not require doping and therefore do not rely
on oxidized materials to improve conductivity or the suppression of
ion diffusion between layers.
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