| Literature DB >> 34845861 |
Long Hu1,2, Leiping Duan2, Yuchen Yao2, Weijian Chen3, Zizhen Zhou2, Claudio Cazorla4, Chun-Ho Lin2, Xinwei Guan2, Xun Geng2, Fei Wang2, Tao Wan2, Shuying Wu1, Soshan Cheong5, Richard D Tilley5, Shanqin Liu6, Jianyu Yuan7, Dewei Chu2, Tom Wu2, Shujuan Huang1.
Abstract
Structural defects are ubiquitous for polycrystalline perovskite films, compromising device performance and stability. Herein, a universal method is developed to overcome this issue by incorporating halide perovskite quantum dots (QDs) into perovskite polycrystalline films. CsPbBr3 QDs are deposited on four types of halide perovskite films (CsPbBr3 , CsPbIBr2 , CsPbBrI2 , and MAPbI3 ) and the interactions are triggered by annealing. The ions in the CsPbBr3 QDs are released into the thin films to passivate defects, and concurrently the hydrophobic ligands of QDs self-assemble on the film surfaces and grain boundaries to reduce the defect density and enhance the film stability. For all QD-treated films, PL emission intensity and carrier lifetime are significantly improved, and surface morphology and composition uniformity are also optimized. Furthermore, after the QD treatment, light-induced phase segregation and degradation in mixed-halide perovskite films are suppressed, and the efficiency of mixed-halide CsPbIBr2 solar cells is remarkably improved to over 11% from 8.7%. Overall, this work provides a general approach to achieving high-quality halide perovskite films with suppressed phase segregation, reduced defects, and enhanced stability for optoelectronic applications.Entities:
Keywords: defect; halide perovskites; phase segregation; quantum dots; solar cells
Year: 2021 PMID: 34845861 PMCID: PMC8805552 DOI: 10.1002/advs.202102258
Source DB: PubMed Journal: Adv Sci (Weinh) ISSN: 2198-3844 Impact factor: 16.806
Figure 1Processing of perovskite films with the QD passivation treatment. a) Precursor solution is spin‐coated on the substrate, then antisolvent containing CsPbBr3 QDs is dropped on precursor solution during the spin‐coating process. b) CsPbBr3 QDs self‐assemble on the surface of deposited films, which contain halide vacancies and under‐charged Pb. c) The ions released from QDs diffuse into halide vacancies and organic ligands coordinate under‐charged Pb atoms during the annealing. d) The crystallized halide perovskite film. SEM images of four kinds of perovskite films (CsPbBr3, CsPbIBr2, CsPbI2Br, and MAPbI3). e–h) without and i–l) with QD treatment. Heterogeneous spots on thin films without the QD treatment are marked with red cycles and ellipses. The scale bar is 300 nm in (e–l).
Figure 2a–d) Steady‐state and e–h) time‐resolved PL measured on four kinds of perovskite films (CsPbBr3, CsPbIBr2, CsPbI2Br, and MAPbI3) without and with QD treatment.
PL lifetime of four types of perovskite film extracted from the PL decay curves by using single‐exponent fitting
| Film Type | CsPbBr3 | CsPbIBr2 | CsPbBrI2 | MAPbI3 |
|---|---|---|---|---|
| With QDs | 7.90 ns | 8.65 ns | 9.25 ns | 53.2 ns |
| W/O QDs | 2.77 ns | 3.81 ns | 4.69 ns | 23.5 ns |
Figure 3XPS core spectra of a) Pb 4f and b) O 1s in the CsPbIBr2 films with and without the QD treatment. c) Dark J–V curves of the two CsPbIBr2 films. PL mapping results for d,e) the QD‐treated CsPbIBr2 film and f,g) the control film in the wavelength ranges of 550–630 nm (original phase) and 665–715 nm (segregated phase). The length of the scale bars is 2 µm.
Figure 4DFT calculated DOS: a) COOH@under‐charged Pb atoms, b) Under‐charged Pb atoms, c) COOH@halide vacancy, and d) halide vacancy systems. Cs, Pb, I, Br, C, O, and H atoms are represented with cyan, grey, purple, brown, black, red, and pink spheres, respectively. Electronic orbitals stemming from the C, H, and Pb atoms notably hybridize around the Fermi energy.
Figure 5a) Schematical architecture, b) J–V characteristics, c) EQE curves, and d) the semi‐logarithmic plot to extract the Urbach energy. e) Dark current and f) EIS curves of the CsPbIBr2 solar cells.
Statistics for the device performance of CsPbIBr2 solar cells (the champion parameters in parenthesis and 24 devices for each type)
| Device Type |
|
| FF | PCE [%] |
|---|---|---|---|---|
| With QDs | 1.25 ± 0.04 (1.29) | 11.4 ± 0.6 (11.6) | 0.74 ± 0.02 (0.75) | 10.7 ± 0.3 (11.1) |
| W/O QDs | 1.21 ± 0.04 (1.22) | 10.7 ± 0.7 (10.8) | 0.64 ± 0.03 (0.66) | 8.3 ± 0.3 (8.7) |