| Literature DB >> 34484588 |
Lu Zhang1, Peng Yu1, Xiao-Yan Wang1.
Abstract
BACKGROUND/Entities:
Keywords: Gloss; Nanofilled composite; Nanohybrid composite; Surface roughness
Year: 2021 PMID: 34484588 PMCID: PMC8403785 DOI: 10.1016/j.jds.2021.03.003
Source DB: PubMed Journal: J Dent Sci ISSN: 1991-7902 Impact factor: 2.080
Information of resin-based composites used in the study.
| Material | Abbreviation | Classification | Composition | Filler Ratio(wt%/vol%) | Manufacture |
|---|---|---|---|---|---|
| Harmonize | HM | Nanohybrid | 81/64.5 | Kerr | |
| Filtek Z350 XT | FT3 | Nanofilled | 78.5/63.3 | 3M ESPE | |
| Tetric N-Ceram | TN | Nanohybrid | 75-77/53-55 | Ivoclar Vivadent | |
| Filtek Z250 | FT2 | Microhybrid | 82/60 | 3M ESPE | |
Polishing systems used in the study.
| Polishing system | Approximate Average Particle Size | Manufacture |
|---|---|---|
| Sof-Lex-SL Red | 60 μm | 3M ESPE |
| Sof-Lex-SL Medium orange | 30 μm | 3M ESPE |
| Sof-Lex-SL Light orange | 30 μm | 3M ESPE |
| Sof-Lex-SL Yellow | 3 μm | 3M ESPE |
Surface roughness Ra values of resin-based composites (μm).
| Material | Matrix strip | Sandpaper | Sof-Lex |
|---|---|---|---|
| HM | 0.091 ± 0.012ABa | 1.016 ± 0.124Ab | 0.227 ± 0.048Ac |
| FT3 | 0.087 ± 0.012Aa | 0.932 ± 0.072ABb | 0.269 ± 0.059Ac |
| TN | 0.100 ± 0.015Ba | 0.949 ± 0.111ABb | 0.225 ± 0.065Ac |
| FT2 | 0.092 ± 0.008ABa | 0.856 ± 0.099Bb | 0.269 ± 0.065Ac |
∗Different uppercase letters in each column and different lowercase letters in each row indicate significant differences by the same surface treatments and within the same materials, respectively (P < 0.05). HM (Harmonize), FT3 (Filtek Z350 XT), TN (Tetric N-Ceram), FT2 (Filtek Z250).
Gloss values of resin-based composites.
| Material | Matrix strip | Sandpaper | Sof-Lex |
|---|---|---|---|
| HM | 95.9 ± 1.3Aa | 9.8 ± 0.6Ab | 54.2 ± 6.3Ac |
| FT3 | 99.9 ± 1.2Ba | 9.2 ± 0.4ABb | 51.0 ± 5.0Ac |
| TN | 92.8 ± 1.5Ca | 9.7 ± 0.7ABb | 53.3 ± 6.7Ac |
| FT2 | 98.0 ± 3.0Da | 9.2 ± 0.7Bb | 44.1 ± 5.7Bc |
∗Different uppercase letters in each column and different lowercase letters in each row indicate significant differences by the same surface treatments and within the same materials, respectively (P < 0.05). HM (Harmonize), FT3 (Filtek Z350 XT), TN (Tetric N-Ceram), FT2 (Filtek Z250).
Figure 1SEM images of all the groups. (A) HM-matrix strip group (red arrow indicates dispersed nanoparticles); (B) HM-sandpaper group; (C) HM-Sof-Lex group; (D) FT3-matrix strip group (red arrow indicates nanocluster); (E) FT3-sandpaper group; (F) FT3-Sof-Lex group; (G) TN-matrix strip group; (H) TN-sandpaper group; (I) TN-Sof-Lex group; (J) FT2-matrix strip group; (K) FT2-sandpaper group; (L) FT2-Sof-Lex group.