| Literature DB >> 34428071 |
Anna Rosławska1,2, Pablo Merino1,3,4, Abhishek Grewal1, Christopher C Leon1, Klaus Kuhnke1, Klaus Kern1,5.
Abstract
Optical spectromicroscopies, which can reach atomic resolution due to plasmonic enhancement, are perturbed by spontaneous intensity modifications. Here, we study such fluctuations in plasmonic electroluminescence at the single-atom limit profiting from the precision of a low-temperature scanning tunneling microscope. First, we investigate the influence of a controlled single-atom transfer from the tip to the sample on the plasmonic properties of the junction. Next, we form a well-defined atomic contact of several quanta of conductance. In contact, we observe changes of the electroluminescence intensity that can be assigned to spontaneous modifications of electronic conductance, plasmonic excitation, and optical antenna properties all originating from minute atomic rearrangements at or near the contact. Our observations are relevant for the understanding of processes leading to spontaneous intensity variations in plasmon-enhanced atomic-scale spectroscopies such as intensity blinking in picocavities.Entities:
Keywords: atomic-scale structure; picocavity; plasmonics; point contacts
Year: 2021 PMID: 34428071 PMCID: PMC8887667 DOI: 10.1021/acs.nanolett.1c02207
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189
Figure 1(a) STM topographic image of the Au(111) surface recorded under electron tunneling conditions, U = −2.5 V, I = 1 nA. During the scan (from top to bottom), a single atom was deliberately deposited from the tip apex onto the surface by atomic manipulation at the position marked by the arrow (for details, see text). Scale bar: 1 nm. (b) Light intensity map recorded simultaneously with (a). The values in the bottom and upper part of the image indicate the average light intensity before and after tip modification. (c) Optical spectra recorded on the position marked by the small circles at the bottom right of (a) and (b) before (yellow curve) and after (red curve) atom deposition; U = −2.5 V, I = 1 nA, integration time: 50 s.
Figure 2(a) Illustration of the experiment in which the tip of an STM forms a single-gold-atom contact. The current passing through the junction excites the luminescence. During measurements, the current, position, and light emission are monitored. (b) Time-trace of optical overbias emission spectra measured for a single-atom contact with a conductance of 1 G0. The plot consists of 100 spectra, each recorded with 5 s of integration time. (c) Spectra from (b) normalized to the maximum. (d,e) Simultaneously recorded light intensity measured by the SPAD (d) and z position (e) with a 20 ms integration time per point. The current feedback was enabled during the measurement to maintain 1 G0, U = 1 V, I = 77.48 μA.
Figure 3(a–c) Conductance (dark gray) and overbias light intensity (red) recorded during tip retraction with a constant speed of 5 pm s–1. The three different point contacts in (a–c) were formed by approaching the tip toward the same surface area until a conductance of 5 G0 was reached. U = −0.8 V. (d) Light intensity vs conductance curve extracted from the data marked by the gray rectangle in (c). Note the existence of a local minimum at 1 G0. Further data sets can be found in the Supporting Information.