| Literature DB >> 34422055 |
Taksid Charasseangpaisarn1, Pattarawadee Krassanairawiwong1, Chanidapa Sangkanchanavanich1, Atima Kurjirattikan1, Kanyarak Kunyawatyuwapong1, Natlada Tantivasin1.
Abstract
MATERIALS AND METHODS: Seventy LDS specimens were randomly divided into seven groups. The first group was noncontaminated surface (PC). The six other groups were contaminated with the saliva and silicone disclosing medium and treated with no surface cleansing agent (NC); phosphoric acid (PO); Ivoclean (IV); sodium hydroxide solution (NA); Restorative Cleansing Agent (RC); and hydrofluoric acid (HF). Then, LDS specimens were cementated with Panavia V5 to resin composite rod. Each specimen was subjected to an SBS test. The modes of failure was inspected under light microscope. The surface element of each group was examined by SEM-EDS.Entities:
Year: 2021 PMID: 34422055 PMCID: PMC8373498 DOI: 10.1155/2021/7112400
Source DB: PubMed Journal: Int J Dent ISSN: 1687-8728
Figure 1The protocols for surface treatment of each group.
The composition and pH of cleansing agents using in the study.
| Cleansing agents | pH | Compositions |
|---|---|---|
| Scotchbond Etchant | 2.7 | Orthophosphoric acid, water, poly (vinyl alcohol) |
| Ivoclean | 13.0–13.5 | Sodium hydroxide, ZrO2, water, polyethylene glycol, pigments |
| NaOH solution | 13.0–13.5 | Sodium hydroxide, water |
| Restorative Cleansing Agent | 13.0–13.5 | Sodium hydroxide, water, poly (acrylic acid) polymer, glycerine, pigments |
| IPS Ceramic Etching Gel | 2 | Hydrofluoric acid |
Figure 2The illustration of the overall procedures.
Figure 3The mean SBS and SD of each group.
Figure 4The number of specimens classified by the mode of failure in each group.
Figure 5Surface characterization without cementation of PC (a); NC (b); PO (c); IV (d); NA (e); RC (f); and HF (g).
Figure 6Surface characterization of specimens not etched with hydrofluoric acid 1,000x magnification (a); etched with hydrofluoric acid for 20 seconds at 1,000x magnification (b); and etched with hydrofluoric acid for 20 seconds at 10,000x magnification (c).
Figure 7Fit checker residual observed under an SEM and elements detected at the area with a fit checker residual under an EDS.