Literature DB >> 34092809

Broadband dielectric spectroscopic detection of volatile organic compounds with ZnO nanorod gas sensors.

Papa K Amoah1,2, Pengtao Lin1,2, Helmut Baumgart1,2, Rhonda R Franklin3, Yaw S Obeng4.   

Abstract

Metal-oxide (MO) semiconductor gas sensors based on chemical resistivity necessarily involve making electrical contacts to the sensing materials. These contacts are imperfect and introduce errors into the measurements. In this paper, we demonstrate the feasibility of using contactless broadband dielectric spectroscopy (BDS)-based metrology in gas monitoring that avoids distortions in the reported resistivity values due to probe use, and parasitic errors (i.e. tool-measurand interactions). Specifically, we show how radio frequency propagation characteristics can be applied to study discrete processes on MO sensing material, such as zinc oxide (i.e. ZnO) surfaces, when exposed to a redox-active gas. Specifically, we have used BDS to investigate the initial oxidization of ZnO gas sensing material in air at temperatures below 200 °C, and to show that the technique affords new mechanistic insights that are inaccessible with the traditional resistance-based measurements.

Entities:  

Keywords:  VOC; ZnO; broadband dielectric spectroscopy; microwaves; nanorods

Year:  2021        PMID: 34092809      PMCID: PMC8174144          DOI: 10.1088/1361-6463/abd3ce

Source DB:  PubMed          Journal:  J Phys D Appl Phys        ISSN: 0022-3727            Impact factor:   3.207


  7 in total

1.  Defects in ZnO nanorods prepared by a hydrothermal method.

Authors:  K H Tam; C K Cheung; Y H Leung; A B Djurisić; C C Ling; C D Beling; S Fung; W M Kwok; W K Chan; D L Phillips; L Ding; W K Ge
Journal:  J Phys Chem B       Date:  2006-10-26       Impact factor: 2.991

2.  Synergy of nano-ZnO and 3D-graphene foam electrodes for asymmetric supercapacitor devices.

Authors:  Maryam Toufani; Sibel Kasap; Ali Tufani; Feray Bakan; Stefan Weber; Emre Erdem
Journal:  Nanoscale       Date:  2020-05-06       Impact factor: 7.790

3.  Metrology for the next generation of semiconductor devices.

Authors:  N G Orji; M Badaroglu; B M Barnes; C Beitia; B D Bunday; U Celano; R J Kline; M Neisser; Y Obeng; A E Vladar
Journal:  Nat Electron       Date:  2018

4.  Dopant profiling and surface analysis of silicon nanowires using capacitance-voltage measurements.

Authors:  Erik C Garnett; Yu-Chih Tseng; Devesh R Khanal; Junqiao Wu; Jeffrey Bokor; Peidong Yang
Journal:  Nat Nanotechnol       Date:  2009-03-15       Impact factor: 39.213

5.  Structural, Optical and Electrical Properties of Zinc Oxide Layers Produced by Pulsed Laser Deposition Method.

Authors:  G Wisz; I Virt; P Sagan; P Potera; R Yavorskyi
Journal:  Nanoscale Res Lett       Date:  2017-04-04       Impact factor: 4.703

6.  Broadband Dielectric Spectroscopic Characterization of Thermal Stability of Low-k Dielectric Thin Films for Micro- and Nanoelectronic Applications.

Authors:  Christopher E Sunday; Karl R Montgomery; Papa K Amoah; Yaw S Obeng
Journal:  ECS J Solid State Sci Technol       Date:  2017-08-29       Impact factor: 2.070

7.  Evolution of native defects in ZnO nanorods irradiated with hydrogen ion.

Authors:  Tengfei Wu; Aiji Wang; Li Zheng; Guangfu Wang; Qingyun Tu; Bowen Lv; Zilin Liu; Zhenglong Wu; Yinshu Wang
Journal:  Sci Rep       Date:  2019-11-22       Impact factor: 4.379

  7 in total

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