Literature DB >> 34006879

Self-clocking fast and variation tolerant true random number generator based on a stochastic mott memristor.

Gwangmin Kim1, Jae Hyun In1, Young Seok Kim1, Hakseung Rhee1, Woojoon Park1, Hanchan Song1, Juseong Park1, Kyung Min Kim2.   

Abstract

The intrinsic stochasticity of the memristor can be used to generate true random numbers, essential for non-decryptable hardware-based security devices. Here, we propose a novel and advanced method to generate true random numbers utilizing the stochastic oscillation behavior of a NbOx mott memristor, exhibiting self-clocking, fast and variation tolerant characteristics. The random number generation rate of the device can be at least 40 kb s-1, which is the fastest record compared with previous volatile memristor-based TRNG devices. Also, its dimensionless operating principle provides high tolerance against both ambient temperature variation and device-to-device variation, enabling robust security hardware applicable in harsh environments.

Entities:  

Year:  2021        PMID: 34006879     DOI: 10.1038/s41467-021-23184-y

Source DB:  PubMed          Journal:  Nat Commun        ISSN: 2041-1723            Impact factor:   14.919


  2 in total

1.  Bi2O2Se-Based True Random Number Generator for Security Applications.

Authors:  Bo Liu; Ying-Feng Chang; Juzhe Li; Xu Liu; Le An Wang; Dharmendra Verma; Hanyuan Liang; Hui Zhu; Yudi Zhao; Lain-Jong Li; Tuo-Hung Hou; Chao-Sung Lai
Journal:  ACS Nano       Date:  2022-03-25       Impact factor: 18.027

2.  A flexible and stretchable bionic true random number generator.

Authors:  Yongbiao Wan; Kun Chen; Feng Huang; Pidong Wang; Xiao Leng; Dong Li; Jianbin Kang; Zhiguang Qiu; Yao Yao
Journal:  Nano Res       Date:  2022-03-08       Impact factor: 10.269

  2 in total

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